Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source

Abstract

A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS includes a plurality of focus points (N) defined along a length of the MFXS collinear with the y-axis. The MFXS is configured to generate the plurality of primary beams, and at least M coherent x-ray scatter detectors are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P = W s V M U , where Ws is a lateral extent of the plurality of focus points, U is a distance from the y-axis to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X=L.

Description

Technical field [0001] The embodiments of the present invention described herein relate to a multi-detector inverted fan beam X-ray diffraction imaging (MIFB XDI) system, and, more particularly, to an X-ray source suitable for use with the MIFB XDI system. Background technique [0002] Known security screening systems are used at travel checkpoints to check whether weapons, narcotics, and / or explosives are hidden in carry-on bags and / or consignments. At least some known security screening systems include x-ray imaging systems. In an x-ray imaging system, an x-ray source emits x-rays toward a detector, the X-rays pass through an object or container, such as a suitcase, and then the output of the detector is processed to identify one or more objects in the container and / Or one or more substances. [0003] At least some known security inspection systems include multi-detector inverted fan beam X-ray diffraction imaging (MIFB XDI) systems. The MIFB XDI system uses an inverted fan ...

AI Technical Summary

Problems solved by technology

[0004] However, for at least some XDI systems that include MFXS in an inverted fan beam geometry, the distribution of the scattered signal over the object under investigation (such as a suitcase) can be significantly non-uniform

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