88results about "X-ray tube details" patented technology

Disclosed is a device and method for generating X-rays having different energy levels as well as a material discrimination system thereof. The method comprises the steps of: generating a first pulse voltage, a second pulse voltage, a third pulse voltage and a fourth pulse voltage, generating a first electron beam having a first beam load and a second electron beam having a second beam load, respectively, based on the first pulse voltage and second pulse voltage, generating a first microwave having a first power and a second microwave having a second power, respectively, based on the third pulse voltage and the fourth pulse voltage, accelerating the first and second electron beams respectively using the first and second microwave to obtain the accelerated first electron beam and the second electron beam, hitting a target with the accelerated first electron beam and the second electron beam to generate a first X-ray and a second X-ray having different energy levels. The X-rays having different energy levels generated by the present invention can be used in the non-destructive inspection for large-sized container cargo at places such as Customs, ports and airports, and in realizing the material discrimination for the inspected object.

The method comprises: generating first, second, third and fourth pulse voltages; according to the first and second pulse voltage, generating a firs and a second electron beam respectively having a first beam loading and a second beam loading; according to the third and fourth pulse voltage, generating a first and a second microwaves respectively having a first power and second power; using the first and second microwaves to respectively accelerating the first and second beams in order to generate a first and a second accelerated beams; using the first and second accelerated beams to bomb the target in order to generating a first and a second X rays each having different energy.

Systems, methods and apparatus are provided through which in some embodiments, a wrap-around capture device of an X-ray collimator frame limits movement of an X-ray tube mounting bracket away from the X-ray collimator. In some embodiments, a C-shaped passive capture device is attached or mounted on the wrap-around capture device, having a portion that is positioned in between the wrap-around capture device and the X-ray collimator frame, which further limits movement of the X-ray tube mounting bracket.

Embodiments of an X-ray source for a mobile X-ray diagnostic unit with a C-arm include a generator vessel that may be mounted to a hollow frame of the C-arm. The generator vessel may have a first subregion with a high-voltage generator and a second subregion with an X-ray source. In some embodiments, the first subregion, the second subregion, or both subregions may be at least partially inside a portion of the hollow frame of the C-arm. The generator vessel may be at least partially filled with insulating oil for cooling the high-voltage generator and / or the X-ray source.

A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS includes a plurality of focus points (N) defined along a length of the MFXS collinear with the y-axis. The MFXS is configured to generate the plurality of primary beams, and at least M coherent x-ray scatter detectors are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P = W s V M U , where Ws is a lateral extent of the plurality of focus points, U is a distance from the y-axis to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X=L.

An X-ray detector comprises a directly converting semiconductor layer having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source or light omitted by at least one light source. An evaluation unit calculates evaluation signals per pixel or group of pixels from first electrical measurement signals generated when light from said at least one light source at a first intensity is coupled into the semiconductor layer, and second electrical measurement signals generated when light from said at least one light source at a second intensity is coupled into the semiconductor layer. A detection unit determines detection signals from electrical measurement signals generated when x-ray radiation is incident onto the semiconductor layer, and a calibration unit calibrates the detection unit on the basis of the evaluation signals.

At least one exemplary embodiment is directed to a light source which includes a plasma generator configured to generate plasma, a mirror configured to reflect light that is produced by the plasma, a plurality of plates provided between the plasma and the mirror and arranged radially around an axis passing through a light emission center, and a magnetic-field generator for generating a magnetic line of force between the plasma and the mirror so that trajectories of charged particles scattering from the plasma are curved toward the plates.