Method for preparing ultrathin strain material-on-insulator
A technology for strained materials and insulators, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., and can solve the problems of crystal quality limitation of strained materials on insulators, complicated preparation processes, and inability to prepare high-speed
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Embodiment 1
[0020] The preparation method of the ultra-thin strain material on the insulator provided by the present invention comprises the following steps: the main points are as follows:
[0021] 1. First select a layer of semiconductor substrate material 11, such as a silicon substrate, then epitaxially grow another layer of semiconductor material 12 on the selected semiconductor material in step 1, requiring the lattice constant of the newly grown material 12 to be higher than the first A layer of semiconductor selected substrate material 11 has a large lattice constant, and the general formula of the epitaxially grown semiconductor material is Si 1-x Ge x , the thickness of the new epitaxial growth semiconductor material 12 is within the critical thickness, so that the crystal is in a fully strained state, and the quality of the crystal is also guaranteed at the same time, for example: Si 1-x Ge x The thickness of the layer is between 80-120nm( figure 1 a);
[0022] 2. Perform o...
Embodiment 2
[0026] In Embodiment 1, the semiconductor silicon material 11 is replaced by germanium material. All the other are with embodiment 1.
Embodiment 3
[0028] In Embodiment 1, the annealing temperature is 1000-1200° C., and the annealing time is 30-60 minutes. The insulating buried layer 13 is formed during the annealing process. All the other are with embodiment 1 or 2.
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Abstract
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