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Method for preparing ultrathin strain material-on-insulator

A technology for strained materials and insulators, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., and can solve the problems of crystal quality limitation of strained materials on insulators, complicated preparation processes, and inability to prepare high-speed

Inactive Publication Date: 2012-09-26
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The traditional methods of preparing strained materials on insulators generally use processes such as epitaxy, bonding, back grinding, or intelligent stripping. In actual operation, they are affected by a variety of different processes, and the preparation process is extremely complicated, resulting in the strain on the final prepared insulator Material crystal quality is limited
[0003] Manufacturing smaller-sized, higher-performance devices has always been the goal and direction of the development of the semiconductor industry. With the development of semiconductor technology, it is no longer possible to manufacture sufficiently high-speed, low-power transistors solely relying on silicon materials.

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  • Method for preparing ultrathin strain material-on-insulator
  • Method for preparing ultrathin strain material-on-insulator

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Embodiment 1

[0020] The preparation method of the ultra-thin strain material on the insulator provided by the present invention comprises the following steps: the main points are as follows:

[0021] 1. First select a layer of semiconductor substrate material 11, such as a silicon substrate, then epitaxially grow another layer of semiconductor material 12 on the selected semiconductor material in step 1, requiring the lattice constant of the newly grown material 12 to be higher than the first A layer of semiconductor selected substrate material 11 has a large lattice constant, and the general formula of the epitaxially grown semiconductor material is Si 1-x Ge x , the thickness of the new epitaxial growth semiconductor material 12 is within the critical thickness, so that the crystal is in a fully strained state, and the quality of the crystal is also guaranteed at the same time, for example: Si 1-x Ge x The thickness of the layer is between 80-120nm( figure 1 a);

[0022] 2. Perform o...

Embodiment 2

[0026] In Embodiment 1, the semiconductor silicon material 11 is replaced by germanium material. All the other are with embodiment 1.

Embodiment 3

[0028] In Embodiment 1, the annealing temperature is 1000-1200° C., and the annealing time is 30-60 minutes. The insulating buried layer 13 is formed during the annealing process. All the other are with embodiment 1 or 2.

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Abstract

The invention relates to a method for preparing an ultrathin material-on-insulator. The method is characterized by comprising the following steps of: epitaxially growing a layer of semiconductor material on a selected semiconductor substrate material, wherein the thickness of the epitaxially grown semiconductor material is within the critical thickness, and crystals are in a full strain state; implanting oxygen ions to ensure that the oxygen ions are mainly distributed in the semiconductor substrate material; and performing high-temperature annealing at the temperature of between 800 and 1,200 DEG C to form an insulating buried layer and simultaneously relax the top of the epitaxially grown semiconductor material so as to transfer stress to the top of the substrate material and form a newstrain layer, wherein the thickness of the prepared ultrathin strain material layer is less than or equal to 50nm. By combining the oxygen ion implantation with the epitaxial process into one step, the processes of bonding and stripping are saved, and silicon-on-insulator is simply prepared.

Description

technical field [0001] The invention relates to a method for preparing an ultra-thin strain material on an insulator, and belongs to the field of silicon-on-insulator (SOI) materials and their preparation. Background technique [0002] The traditional methods of preparing strained materials on insulators generally use processes such as epitaxy, bonding, back grinding, or intelligent stripping. In actual operation, they are affected by a variety of different processes, and the preparation process is extremely complicated, resulting in the strain on the final prepared insulator Material crystal quality is limited. [0003] Manufacturing smaller-sized, higher-performance devices has always been the goal and direction of the development of the semiconductor industry. With the development of semiconductor technology, it is no longer possible to manufacture sufficiently high-speed, low-power transistors solely relying on silicon materials. Starting from the 90nm process, strained...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/762H01L21/265
Inventor 张苗张波王曦薛忠营魏星武爱民
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI