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System and method for patent technology citation analysis

An analysis system and patent analysis technology, applied in the field of patent technology citation analysis system, to achieve in-depth and specific analysis results

Inactive Publication Date: 2011-04-06
J Z M C INTPROP DATA SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no method for citation analysis of patents by technology, which enables analysts to quickly and accurately obtain the distribution of citation patents related to technologies of interest and find key patents according to the number of citations

Method used

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  • System and method for patent technology citation analysis
  • System and method for patent technology citation analysis
  • System and method for patent technology citation analysis

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Experimental program
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Effect test

Embodiment Construction

[0026] Such as figure 1 Shown is the block diagram of patent technology citation analysis system. The system includes a patent database 10 for storing patent data, a topic building module 20 for collecting and analyzing data from the patent database to establish a patent analysis topic database, and a patent classification module 30 for classifying patent documents in the patent analysis topic database according to technology. The technology classification selection module 40 of the patent technology classification, the citation generation module 50 for generating the citation quantity of the selected technology classification patent, and the citation display module 60 for displaying the cited patent data under the selected technology classification.

[0027] The patent data in the described patent database 10 at least includes patent bibliographic data and patent abstracts, and the described topic building module 20 includes a retrieval unit 201, which is used to sort by keyw...

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Abstract

The invention provides a system and a method for patent technology citation analysis. The system comprises a patent database, a subject creating module, a patent classification module, a technology classification selecting module, a citation generating module and a citation display module, wherein the patent database stores patent data; the subject creating module collects analysis data from the patent database and creates a patent analysis subject database; the patent classification module classifies patent documentations in the patent analysis subject database according to technologies; the technology classification selecting module selects patent technology classes; the citation generating module generates the citation quantity of the selected technology classification patent; and the citation display module displays the citation patent data under the selected technology classification. The method is realized by adopting the modules of the system. Due to the adoption of the system and the method, a patent analysis person can quickly and accurately obtain the citation quantity distribution of patent related to interested technologies, and can clearly find a key patent according to the citation quantity for further analyzing the patents conveniently.

Description

technical field [0001] The invention relates to a patent analysis system and method, in particular to a patent technology citation analysis system and method. Background technique [0002] Citation-based patent research is called patent citation analysis, which explores the links between patents in the same way that scientific papers cite links. When a patent is cited more times, then this patent is likely to contain an important technological development trend, and many subsequent patents are researched on the basis of it. The number of patent citations reveals the importance of the patent to a certain extent. [0003] Patent Publication No. TWI290698 discloses a system and method for timely updating and displaying patent citation information, which can update patent citation information in real time and display the citation relationship between patents with a star-shaped hyperbolic number. At present, there is no method for citation analysis of patents by technology, whi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 唐向东魏国柱
Owner J Z M C INTPROP DATA SCI & TECH
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