Load lock chamber
A sampling chamber, vacuum technology, applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as bending and cracking of the main body of the vacuum sampling chamber
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2011-06-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The present invention relates to a vacuum loading chamber (load lock chamber, also referred to as "load fixing chamber" or "loading / unloading chamber"), more specifically, before and after performing a large-area processed substrate process, Vacuum load chamber for loading and unloading substrates to be processed. Background technique
[0002] Generally speaking, when manufacturing products such as liquid crystal display devices and solar cells, it is necessary to perform various manufacturing processes such as depositing various thin films on substrates such as glass substrates and patterning the deposited thin films. And these processes are done in processing chambers that provide optimum conditions for the execution of the respective processes. Especially recently, a substrate processing system in which a plurality of processing chambers are arranged in a cluster structure so as to process a plurality of substrates in a short period of time is wide...
Examples
Embodiment Construction
[0028] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The above features and effects of the present invention will become clearer through the following detailed description in conjunction with the accompanying drawings, and those skilled in the art of the present invention can easily implement the technical idea of the present invention. The present invention is not limited to the following embodiments, but can be realized in other ways. The role of each embodiment described in this specification is to disclose the technical content more completely and fully convey the technical ideas and features of the present invention to those skilled in the art. In the drawings, in order to clearly illustrate the present invention, the thickness of each device or film (layer) and region is exaggerated, and each device may include various additional devices not described in this specification.
[0029]...