Load lock chamber
A sampling chamber and vacuum technology, applied in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as bending and cracking of the main body of the vacuum sampling chamber
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[0028] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The above features and effects of the present invention will become clearer through the following detailed description in conjunction with the accompanying drawings, and those skilled in the art of the present invention can easily implement the technical idea of the present invention. The present invention is not limited to the following embodiments, but can be realized in other ways. The role of each embodiment described in this specification is to disclose the technical content more completely and fully convey the technical ideas and features of the present invention to those skilled in the art. In the drawings, in order to clearly illustrate the present invention, the thickness of each device or film (layer) and region is exaggerated, and each device may include various additional devices not described in this specification.
[0029]...
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