Photon-integrated-circuit-based instantaneous microwave frequency measurement device and method

Abstract

The invention discloses a photon-integrated-circuit-based instantaneous microwave frequency measurement device and a photon-integrated-circuit-based instantaneous microwave frequency measurement method. The device comprises a laser device, a photon integrated circuit, a first photoelectric detector, a second photoelectric detector and a microwave amplitude comparison and signal processing module. The method comprises that: after laser enters the integrated circuit, the laser is divided into two paths, and the two paths of laser are controlled by microwave signals respectively to obtain opposite phase modulation; the upper path of signals and partial lower path of signals are subjected to laser synthesis to form strength signals a; the rest lower path of signals are converted into strength signals b through a waveguide grating; the two signals a and b pass through the photoelectric detectors and then undergo amplitude comparison; and because the response of the waveguide grating is designed into linearity, the monitored parameter and the microwave frequency have a single mapping relationship (direct ratio), so that instantaneous measurement of the frequency of the signals to be measured is realized. The device has largest measurement range under given measurement precision, is calibrated only by a single frequency source, and can measure the central frequency of pulse signals. The device has the advantages of small volume, high reliability, low complexity and the like.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine

Login to View More

AI Technical Summary

Benefits of technology

This technology simplifies the process for manufacturing an integrated circuit (IC) chip without increasing its overall dimensions or requiring more expensive components like lasers. It also allows for precise measurements over various ranges while maintaining good performance levels.

Problems solved by technology

Technological Problem addressed in this patented technical problem is how to measure very broadband radiofrequency waves accurately without being bulky due to its complicated structure and expensive equipment. Current techniques involve multiple steps involving separate measurements and data analysis processes, making them impractically slow and prone to errors caused by environmental factors like temperature changes. To address these issues, an improved approach called Photoacousmunication Interferometer System (PIAS), described in detail below, proposes use of a new technology called Photonsense Multiplexed Frequency Identification Microscopy (PMFMIDAR) that combines two waveforms together through interaction between their own unique characteristics. By doing away all necessary electronics, PIAS becomes more efficient and reliable compared to previous systems.

Images