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Examining system, examining method, CT (computed tomography) device and detecting device

A technology for inspection systems and inspection methods, applied in the field of inspection systems, can solve the problems of increasing the number of rows, not being so realistic, and high cost of detectors

Active Publication Date: 2011-09-07
TSINGHUA UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the high cost of detectors, it is not realistic to increase the number of rows significantly

Method used

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  • Examining system, examining method, CT (computed tomography) device and detecting device
  • Examining system, examining method, CT (computed tomography) device and detecting device
  • Examining system, examining method, CT (computed tomography) device and detecting device

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Embodiment Construction

[0027] The embodiments of the present invention will be described in detail below. Examples of the embodiments are shown in the drawings, in which the same reference numerals denote the same elements throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0028] Such as figure 1 with 2 As shown in the figure, the inspection system according to the present invention includes: a CT device including: a slip ring, a ray source connected to the slip ring, a detection device opposite to the ray source and connected to the slip ring; and conveying the inspected object The transmission device, wherein the detection device includes N rows of detectors, and there is a predetermined interval between two adjacent rows of the detectors, where N is an integer greater than 1.

[0029] In an embodiment of the present invention, the inspection system may further include a scanning imaging device for obtaining a two-dimensional image, ...

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Abstract

The invention provides an examining system, wherein the system comprises a CT (computed tomography) device which comprises a slip ring, a ray source connected to the slip ring, a detecting device opposite to the ray source and connected to the slip ring, and a transmitting device for transmitting examined objects; when the examined objects are progressed and approached to the plane at which the slip ring is positioned, the examined objects are slowed down for progressing at a low speed, and are accelerated for progressing at a high speed after the ray sources stops emitting rays, wherein the detecting device comprises N lines of detectors; a predetermined interval is reserved between two adjacent lines of detectors; N is an integer greater than one. By utilizing the examining system provided by the invention, the high-speed scan imaging of the CT device is realized, and the CT device and a scan imaging device for obtaining two-dimensional images are possibly used synchronously, so that the defects between the CT device and the scan imaging device are overcome.

Description

[0001] This application is a divisional application of the patent application with the application number 200710176528.4, the title of the invention "inspection system, inspection method, CT device and detection device", and the application date on October 30, 2007. Technical field [0002] The invention relates to an inspection system, an inspection method, a CT device and a detection device. Background technique [0003] In order to solve the scanning speed problem of the CT device, the conventional method is to use multiple rows of detectors, so that multiple rows of data can be collected at the same time, for example, patent application WO2005 / 119297. However, due to the high cost of the detector, it is not so realistic to increase the number of rows significantly. Summary of the invention [0004] The present invention proposes an inspection system, an inspection method, a CT device, and a detection device, wherein the detection device can effectively reduce the number of dete...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01V5/00
Inventor 张丽陈志强胡海峰李元景刘以农孙尚民张文宇邢宇翔
Owner TSINGHUA UNIV
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