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Probe block assembly

A probe block and component technology, applied in the field of probe block components, can solve the problems of high cost and time-consuming

Inactive Publication Date: 2011-09-21
3M INNOVATIVE PROPERTIES CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Replacing a damaged probe can be costly and time consuming because the damaged probe must be pulled or pressed out of the hole it is press fit into

Method used

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  • Probe block assembly
  • Probe block assembly
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Examples

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Embodiment Construction

[0020] In the following detailed description, reference is made to the accompanying drawings, which form a part hereof, and in which are shown by way of illustrations specific embodiments in which the invention may be practiced. In this regard, directional terms such as "upper," "lower," "front," "rear," "front," "tail," etc. are used with reference to the orientation of the figures being described. Because components of an embodiment may be disposed in many different orientations, directional terms are used for purposes of illustration and in no way limit the invention. It is to be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present invention. Accordingly, the following detailed description should not be taken in a limiting sense, and the scope of the invention is defined by the appended claims.

[0021] It should be understood that the features of the various exemplary embodiments de...

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Abstract

A probe block assembly includes a block and a cable terminated to a coaxial connector that is configured to electrically communicate with a plurality of probes inserted in the block. The coaxial connector includes a connector signal contact configured to separably connect to a first probe that is insertable into an aperture of the block and insulated from the block, and a resilient ground beam configured to commonly ground one or more second probes inserted in the block.

Description

Background technique [0001] Probe blocks are used to evaluate integrated circuits or other electronic devices and include probes that provide a contact interface between an automatic test equipment test head and the integrated circuit or electronic device being evaluated. Certain probe blocks include spring-loaded probes that provide a temporary spring contact interface between the test head and the integrated circuit, these probe blocks are referred to as spring probe blocks. [0002] Such probe blocks for use in automatic test equipment are typically machined from metal bar stock in complex and costly process steps that allow the precise positioning of the holes and other components of the probe block. For example, the probes are force fit into each hole with an arbor press with about 20 pounds of force. Occasionally, one or more of these probes becomes damaged, for example, when the test head is moved relative to the electronic device being evaluated. Replacing a damaged ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66
CPCG01R31/2889H01L22/00G01R1/067
Inventor 史蒂文·费尔德曼约瑟夫·N·卡斯蒂廖内阿布黑·R·乔希
Owner 3M INNOVATIVE PROPERTIES CO