Test bench for X-ray detection apparatuses

Abstract

The invention discloses a test bench for X-ray detection apparatuses. The test bench is characterized in that a start-up circuit with a DC voltage is connected to earthing pins and milliampere (mA) output pins of a controller output port and a handpiece output port, a high-voltage packet test circuit with an adjustable output voltage is connected with two high-voltage packet voltage output pins of the handpiece output port, two high-voltage packet voltage supply output pins of the controller output port are connected with a waveform display instrument, the two high-voltage packet voltage output pins and pseudo loads of the handpiece output port are respectively connected in series with a normally open contact of an AC relay and then connected in parallel with the waveform display instrument, a control circuit for switching the mutually-exclusive access of the two high-voltage packet voltage output pins and the pseudo loads as well as adjustable alternating voltage loads is composed ofthree AC relays and three sets of button switches; and a X-ray machine technical parameter and waveform display device is composed of a voltmeter, an ammeter and a waveform display instrument. By using the test bench for X-ray detection apparatuses disclosed by the invention, the performance parameters, working conditions and failure positions of a controller of an X-ray machine, a handpiece and a handpiece high-voltage packet can be diagnosed through onekey operation, therefore, the test bench disclosed by the invention can be widely used in the performance test and fault diagnosis and maintenance of the X-ray machine.

Description

technical field [0001] The invention relates to an X-ray flaw detection machine detection test bench, which is used for detecting the technical parameters of the X-ray machine. Background technique [0002] X-ray flaw detector is widely used in national defense industry, boiler, pressure vessel, shipbuilding, papermaking, petrochemical industry, aviation and industrial machinery, etc. It is an ideal equipment for non-destructive testing. Due to the expensive, precise and complex structure of the instrument, the testing steps of performance parameters are cumbersome, the operation is difficult, and there is no professional test bench, which is not convenient for production debugging and maintenance. Contents of the invention [0003] The object of the present invention is to provide an X-ray flaw detector detection test bench, which can quickly detect the performance index of the X-ray flaw detector, and accurately and conveniently detect the performance parameters of the X...

AI Technical Summary

Problems solved by technology

Due to the expensive, precise and complex structure of the instrument, the testing steps of performance parameters are cumbersome, the operation is difficult, and there is no professional test bench, which is not convenient for production debugging and maintenance

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