Method for testing accelerated life of electronic product based on life-stress model

Abstract

The invention discloses a method for testing the accelerated life of an electronic product based on a life-stress model. The method comprises the following steps of: 1, defining the life characteristics of a sample; 2, defining failure criteria; 3, performing accelerated life test of the maximum stress combination; 4, performing accelerated life test of the other combinations, namely performing the test of other four different groups of stress combinations except for the maximum stress combination; 5, processing failure data, namely fitting a weibull distribution model of total life of all groups of test samples by a weibull distribution fitting analysis method and solving the corresponding life characteristic parameter; 6, estimating an accelerator model parameter; 7, determining humidity stress under the using condition; and 8, extrapolating sample failure distribution under the using condition. The method can obviously shorten the time of the accelerated life test of the electronic product, and improve the accuracy of a test result. The method has good practical value and wide application prospect in the technical field of the accelerated life test.

Description

(1) Technical field: [0001] The invention relates to an accelerated life test method based on a "life-stress" model, in particular to an accelerated life test method for electronic products based on a "life-stress" model. It is an accelerated model based on Weibull life distribution model and Peck temperature and humidity model, and belongs to the technical field of accelerated life test. (2) Background technology: [0002] In recent years, with the development of reliability test technology, accelerated life test has gradually become one of the main means to identify the reliability life of products. The so-called accelerated life test is a test to predict the reliability of the product under normal working conditions or storage conditions by using the method of increasing stress to promote the failure of the sample in a short period of time without introducing a new failure mechanism. It uses experiments as a means to record and analyze the failure data of test samples un...

AI Technical Summary

Problems solved by technology

For the former, the accelerated life test is undoubtedly very effective, because under accelerated conditions, the higher stress can expose the weak links of the product as soon as possible, thereby discovering the defects in the design and production links; while for the second use In other words, the situation is more complicated

Because it is difficult to establish the corresponding relationship between the accelerated conditions and the failure characteristics of the product under the use conditions, it is likely that the faults exposed under the accelerated conditions will not occur at all under the use conditions, or the improper setting of the accelerated conditions will lead to the introduction of new failure mechanisms , so that the accelerated life test loses the basis for acceleration

Moreover, no accelerated life model can accurately describe the life-stress relationship of a product, and each accelerated model is only applicable to a specific type of product. Therefore, selecting an appropriate accelerated model is the key to the success of the accelerated life test

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