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Electronic device test system and method

A technology for electronic devices and test systems, which is applied in the detection of faulty computer hardware and other directions, and can solve the problems of time-consuming and inconvenient test procedures.

Inactive Publication Date: 2012-05-16
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such a testing process is time-consuming and inconvenient

Method used

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  • Electronic device test system and method
  • Electronic device test system and method
  • Electronic device test system and method

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Embodiment Construction

[0028] The following will clearly illustrate the spirit of the present invention with the accompanying drawings and detailed descriptions. After any person with ordinary knowledge in the technical field understands the preferred embodiments of the present invention, he can change and modify it by the technology taught in the present invention. without departing from the spirit and scope of the present invention.

[0029] Please refer to figure 1 , which is a functional block diagram of an electronic device testing system according to an embodiment of the present invention. The electronic device testing system conducts a functional test on the device under test through the data transmission device with thermal removal function, and after the functional test is completed, the data transmission device is thermally removed.

[0030] The electronic device testing system includes a first data transmission device 100 , an interface card 200 and a computer 300 . The first data trans...

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Abstract

The invention provides an electronic device test system and method. The electronic device test system comprises a first data transmission device, an interface adapter card and a computer, wherein the first data transmission device has the function of hot removal; the interface adapter card comprise a second data transmission interface and a conversion module; the second data transmission interface is to be connected with a device to be tested; the conversion module is electrically connected with the first data transmission device and the second data transmission interface, and used for converting data transmitted between the first data transmission device and the second data transmission interface; the computer comprises a processing unit; the processing unit is connected with the interface adapter card through the first data transmission device; the processing unit enables the first data transmission device to perform a function test on the device to be tested through the interface adapter card; and after the function test is completed, the processing unit removes the first data transmission device by using the hot removal function.

Description

technical field [0001] The present invention relates to a testing system and method, and in particular to an electronic device testing system and method. Background technique [0002] With the rapid development of information technology, the application of computer hardware devices is becoming more and more popular. These computer hardware devices include a display card for displaying data on the screen, a sound card for making the computer sound, and a network card for connecting to the network. Take the network card as an example. The network card is a bridge between the host computer and the Internet. If there is no network card, the host computer cannot connect to the Internet. [0003] When these computer hardware devices are manufactured, a set of testing methods is needed to test the functions and performance of these hardware devices. For example, when testing a network card, the network card will be enabled first, and then it will be confirmed whether the host can...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 饶耀中蔡圣源王定宏庄濬维张天超
Owner INVENTEC CORP