Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for detecting capacitor deficiency

一种检测电容、旁路电容的技术,应用在测量电、电容器测试、测量电变量等方向,能够解决无法准确的识别出小电容是否存在缺失等问题,达到解决不可测的效果

Inactive Publication Date: 2013-11-20
STATE GRID CORP OF CHINA +1
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, when using the prior art phase difference method, voltage difference method, or capacitance bridge method to measure the total capacitive reactance of the equivalent capacitor, it is impossible to accurately identify whether the small capacitor exists or whether it is missing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for detecting capacitor deficiency
  • Method for detecting capacitor deficiency
  • Method for detecting capacitor deficiency

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] Below in conjunction with accompanying drawing, structural principle and working principle of the present invention are specifically described:

[0030] The detailed features and advantages of the present invention are described in detail below in the embodiments, which are sufficient to enable those skilled in the art to understand the technical content of the present invention and implement it accordingly. The related objects and advantages of the present invention can be easily understood by those skilled in the art.

[0031] figure 1 It is a circuit block diagram of a detection circuit according to an embodiment of the present invention, the detection circuit includes a signal generator (or signal excitation source) 10, a voltage dividing resistor ZR, a voltage sensor 20 and a microprocessor (micro processor) 30 . Wherein, the signal generator 10 is used to provide the AC signal VS, and the voltage dividing resistor ZR is connected between the bypass capacitors C1...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for detecting a capacitor loss is applicable to detecting a plurality of by-pass capacitors connected in parallel to each other. The detection method includes the following steps, an alternating current (AC) signal is input into the by-pass capacitors, in which the AC signal has a plurality of test frequencies; test voltages of the by-pass capacitors at each of the test frequencies are recorded, so as to form a test result table; it is determined whether the test result table is the same as a standard voltage table; and when a result of the determination is NO, a fail signal is output. By applying the detection method, whether a loss exists in the by-pass capacitors can be effectively identified, thereby solving the problem that small capacitors are undetectable when large capacitors are connected in parallel to the small capacitors.

Description

technical field [0001] The invention relates to a method for detecting the lack of capacitance, in particular to a detection method for detecting whether a plurality of bypass capacitors connected in parallel are missing. Background technique [0002] Generally speaking, a printed circuit board (PCB) must complete its electrical testing, appearance and surface defect inspection before leaving the factory. Among them, in order to judge the quality of the electrical properties of the circuit board, the electrical testing item is one of the links that the industry attaches great importance to at present. [0003] For example, when an in-circuit tester performs electrical testing on a circuit substrate, its testing items include testing of discrete components such as resistors, inductors, and capacitors. Among them, when detecting capacitance, since most of the circuit substrates have more than one capacitance; that is to say, when the equivalent capacitance is formed by parall...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/02
CPCG01R31/028G01R31/64
Inventor 金志仁郑全阶宋平陈志丰
Owner STATE GRID CORP OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products