Wheat variety characteristic parameter estimating method based on MCMC

A characteristic parameter, wheat technology, applied in special data processing applications, computing, electrical digital data processing, etc., can solve the problems of low inversion efficiency and inability to search for global optimal variables.

Active Publication Date: 2012-06-13
NANJING AGRICULTURAL UNIVERSITY
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Problems solved by technology

However, these methods have shortcomings such as low inversion efficiency and the inability to search for global optimal variables.

Method used

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  • Wheat variety characteristic parameter estimating method based on MCMC
  • Wheat variety characteristic parameter estimating method based on MCMC
  • Wheat variety characteristic parameter estimating method based on MCMC

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Embodiment Construction

[0043] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0044] The method for estimating characteristic parameters of wheat varieties of the present invention was applied in Xuzhou area, using the growth period and yield data of Xumai 25 wheat variety from 1999 to 2003 in Xuzhou area to effectively estimate the characteristic parameters of Xumai 25. combine figure 1 process in detail.

[0045] 1) Data preparation, WheatGrow model ( figure 2 ) data acquisition, first record the daily meteorological data in the field during the wheat growing season through the automatic weather station, including daily maximum temperature, daily minimum temperature, sunshine hours, and daily rainfall. Using the five-point sampling method, the cultivated layer is divided into four layers from top to bottom for field soil sampling, and then through indoor physical and chemical analysis, the soil bulk densit...

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Abstract

The invention discloses a wheat variety characteristic parameter estimating method based on the MCMC, which mainly includes building probability density function through wheat variety growth period and yield which are actually measured in the field and growth period and yield of wheat growth models and utilizing the MCMC method for inversion to obtain the wheat variety characteristic parameter. The main process includes first obtaining prior probability distribution of the wheat variety characteristic parameter through test calculation, presenting candidate parameter according to initial parameter and the prior probability distribution, calculating probability density function and relieving ratio of the yield and the growth period, judging whether new parameter is accepted or not according to the M-H criterion and finally obtaining posterior probability density distribution of various variety characteristic parameter. The method is accurate and efficient in result estimation and has general serviceability in estimation of wheat variety characteristic parameter of like models.

Description

technical field [0001] The invention belongs to the field of quantitative evaluation of wheat variety characteristics in precision agriculture, and relates to a method for estimating characteristic parameters of wheat varieties, in particular to a method for estimating characteristic parameters of wheat varieties combined with a Markov Chain Monte Carlo method (Markov Chain Monte Carlo, MCMC). Background technique [0002] With the development and progress of agricultural technology, new wheat varieties continue to appear. Scientists have proposed many parameters that can quantify the characteristics of crop varieties through the study of the physiological and ecological characteristics of different varieties, such as plant height, thousand-grain weight, physiological vernalization days, and grain filling. These parameters are called crop variety characteristic parameters, which mainly reflect the genotype characteristics of crops. For more than half a century, many crop gro...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 曹卫星吕尊富朱艳刘小军姚霞汤亮倪军
Owner NANJING AGRICULTURAL UNIVERSITY
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