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A Test Case Reduction Method for Defect Location Based on Dynamic Basic Blocks

A technology of dynamic basic blocks and test cases, applied in software testing/debugging, etc., can solve problems such as reducing the effect of defect location, and achieve the effect of reducing the burden of judgment

Inactive Publication Date: 2014-10-29
NANJING UNIV
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Problems solved by technology

[0005] Yu Y and Jones J studied the effect of the reduction of test case sets on the effect of defect location. Their experiments showed that there is a trade-off between the reduction of test cases and the effect of defect location. Generally speaking, the existing test cases The reduction strategy reduces the effectiveness of defect localization

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  • A Test Case Reduction Method for Defect Location Based on Dynamic Basic Blocks
  • A Test Case Reduction Method for Defect Location Based on Dynamic Basic Blocks
  • A Test Case Reduction Method for Defect Location Based on Dynamic Basic Blocks

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Embodiment Construction

[0031] The defect localization technology based on coverage information ranks the statements by calculating their suspiciousness, and the statements in the same dynamic basic block have the same coverage information and are always given the same suspiciousness, so they cannot be distinguished. On the surface, the defect location technology based on coverage information ranks the suspiciousness of sentences, but in fact it ranks the suspiciousness of the dynamic basic blocks divided by the test case set. The dynamic basic block is the smallest granularity that can be identified by the defect localization technology based on coverage information. Considering this characteristic of dynamic basic blocks, the present invention proposes to use dynamic basic block coverage to reduce test cases. Dynamic basic block coverage expresses each test case as a vector with dynamic basic block as the unit. The steps that the present invention implements mainly comprise:

[0032] 1) Execute t...

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Abstract

The invention provides a defect positioning test case reduction method based on dynamic basic block, comprising the following steps: firstly constructing a statement coverage matrix according to an execution path; secondly converting the statement coverage matrix into a dynamic basic block coverage matrix; thirdly reducing a test cast set needing manual checking result by using two reduction strategies of maximum division strategy MDS and even division strategy EDS so as to save labor; and fourthly using the reduced test case set for detect positioning. According to the invention, a test case sub-set which is much smaller in scale can be selected from an initial test case set, thereby greatly reducing the judgment burden of development personnel to test case output results, and the effect of using such test case set to perform detect positioning is hardly reduced compared with the effect of using the test case set before reduction.

Description

technical field [0001] The invention belongs to the technical field of software testing, and relates to the verification of software testing results and defect location technology. A test case reduction method for defect localization of dynamic basic blocks. Background technique [0002] The defect location technology based on the statement coverage of test execution obtains the dynamic execution information of the program by running the test case set, calculates the suspiciousness of each statement according to the coverage of the statement and the execution result of the use case, and the statement with high suspiciousness is checked first . Among them, the most representative ones are the chipping method of Agrawal et al., the nearest neighbor method of Renieris and Reiss, and the Tarantula method proposed by Jones and Harrold et al. [0003] Research shows that these defect localization techniques based on coverage information can effectively reduce the number of state...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 陈林马倩卢红敏徐宝文
Owner NANJING UNIV
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