Method for measuring attosecond X-ray pulses and application of method

A technology of ray pulse and measurement method, which is applied in the field of attosecond X-ray pulse measurement, and can solve the problems of complex analysis and calculation method and experimental data fitting process, etc.

Inactive Publication Date: 2012-07-04
PEKING UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

However, these methods are all evolved from traditional optical measurement methods, which not only require the most advanced contemporary experimental devices, but also require very complex analytical calculation methods and experimental data fitting processes

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  • Method for measuring attosecond X-ray pulses and application of method
  • Method for measuring attosecond X-ray pulses and application of method
  • Method for measuring attosecond X-ray pulses and application of method

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Embodiment Construction

[0036] In the following, the present invention will be further explained through specific embodiments in conjunction with the drawings.

[0037] As an electromagnetic wave, light is expressed as: The pulse waveform is determined by the time parameter t (or phase ) And the intensity f(t) are represented by physical quantities, so the physical quantities of time and intensity can be obtained to reconstruct the pulse waveform.

[0038] figure 1 It is a schematic diagram of an experimental setup for generating and measuring attosecond X-ray pulses. A strong and short laser, such as a laser pulse with a time width of 7 fs, is focused by the Ag mirror 1 and interacts with the neon atom 2 to produce higher harmonics. The zirconium filter 3 is used to separate the attosecond X-ray pulse with higher energy in the forward direction of the laser beam. The center of the beam is an attosecond X-ray pulse, surrounded by laser pulses. After the light beam passes through the diaphragm 4, a lin...

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Abstract

The invention discloses a method for measuring attosecond X-ray pulses and application of the method. According to the method disclosed by the invention, each measured related phase of a photoelectron is determined by using a parameterized computing formula, and the shape of a pulse and a concrete time structure are rebuilt through one step by using an analytical photoelectron spectrum unscrambling technology; and the time domain characteristics of the attosecond X-ray pulses can be rebuilt from each measured photoelectron spectrum without a large amount of time resolution measurements of a photoelectron spectrum and without a redundant iterative computation and an experimental data fitting process. The time uncertainty of a pulse measurement result is computed from energy bandwidth values of the pulses by using the parameterized formula. Because a direct relation among attosecond pulse time characteristics, important laser parameters (such as peak strength, electric field envelope shape, phase, carrier-envelope phase and the like), atomic or molecular ionization power and the photoelectron spectrum is established by a transformation equation, the method can be used for computing unknown parameters from each known parameter value.

Description

Technical field [0001] The invention belongs to ultrafast optics, and specifically relates to a method for measuring attosecond X-ray pulses and its application. Background technique [0002] In order to study the time evolution of electronic states in ultra-fast processes such as chemical reactions and atomic and molecular luminescence, light pulses with higher and higher energy, shorter time widths, and better energy monochromaticities such as attoseconds (10 -18 Sec) X-ray pulses are used as excitation and detection means. However, traditional instruments such as oscilloscopes that measure pulses are limited by their response speed, and the measurement limit can only reach 10 -10 second. How to quickly and accurately measure the detailed time structure of ultra-short light pulses has always been a challenge in the scientific community. So far, several methods have been developed to measure the time width of attosecond pulses and reconstruct the pulse shape, such as attosecond...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 葛愉成
Owner PEKING UNIV
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