Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring attosecond X-ray pulses and application of method

A technology of ray pulse and measurement method, which is applied in the field of attosecond X-ray pulse measurement, and can solve the problems of complex analysis and calculation method and experimental data fitting process, etc.

Inactive Publication Date: 2013-11-06
PEKING UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these methods are all evolved from traditional optical measurement methods, which not only require the most advanced contemporary experimental devices, but also require very complex analytical calculation methods and experimental data fitting processes

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring attosecond X-ray pulses and application of method
  • Method for measuring attosecond X-ray pulses and application of method
  • Method for measuring attosecond X-ray pulses and application of method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention will be further elaborated below through specific embodiments in conjunction with the accompanying drawings.

[0037] Light as an electromagnetic wave is expressed as: The waveform of the pulse is determined by the time parameter t (or phase ) and intensity f(t) are characterized by physical quantities, so the waveform of the pulse can be reconstructed by obtaining the physical quantities of time and intensity.

[0038] figure 1 is a schematic diagram of the experimental setup for generating and measuring attosecond X-ray pulses. A strong and short laser, such as a laser pulse with a time width of 7 fs, is focused by the Ag mirror 1 and interacts with the neon atoms 2 to generate high-order harmonics. A zirconium filter 3 is used to separate and obtain higher-energy attosecond X-ray pulses in the forward direction of the laser beam. At the center of the beam is an attosecond X-ray pulse surrounded by laser pulses. After the light beam passes...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for measuring attosecond X-ray pulses and application of the method. According to the method disclosed by the invention, each measured related phase of a photoelectron is determined by using a parameterized computing formula, and the shape of a pulse and a concrete time structure are rebuilt through one step by using an analytical photoelectron spectrum unscrambling technology; and the time domain characteristics of the attosecond X-ray pulses can be rebuilt from each measured photoelectron spectrum without a large amount of time resolution measurements of a photoelectron spectrum and without a redundant iterative computation and an experimental data fitting process. The time uncertainty of a pulse measurement result is computed from energy bandwidth values of the pulses by using the parameterized formula. Because a direct relation among attosecond pulse time characteristics, important laser parameters (such as peak strength, electric field envelope shape, phase, carrier-envelope phase and the like), atomic or molecular ionization power and the photoelectron spectrum is established by a transformation equation, the method can be used for computing unknown parameters from each known parameter value.

Description

technical field [0001] The invention belongs to ultrafast optics, in particular to a measurement method and application of attosecond X-ray pulses. Background technique [0002] In order to study the time evolution process of electronic states in ultra-fast processes such as chemical reactions and atomic and molecular luminescence, light pulses with higher and higher energy, shorter time width and better energy monochromaticity are required, such as attoseconds (10 -18 seconds) X-ray pulses as excitation and detection means. However, traditional instruments such as oscilloscopes for measuring pulses are limited by the response speed, and the measurement limit can only reach 10 -10 Second. How to quickly and accurately measure the specific and detailed time structure of ultrashort light pulses has always been a challenge in the scientific community. So far, several methods for measuring the time width of attosecond pulses and reconstructing the pulse shape have been develo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00
Inventor 葛愉成
Owner PEKING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com