A test fixture with alarm function

Abstract

The invention discloses a test fixture with an alarming function. The test fixture comprises an alarming device, a data acquisition device, a logic control device, an all-clear device, and a power supply device, wherein the alarming device is used for outputting an alarming signal and disconnecting the power supply of a fixture; the data acquisition device is used for acquiring the assembly data of the test fixture; the logic control device is used for processing data acquired by the data acquisition device and judging whether each assembly of the test fixture reaches the service life or not; the all-clear device is used for terminating the alarming signal and recovering functions of the fixture; and the power supply device is used for supplying power to the alarming device, the data acquisition device, the logic control device and the all-clear device. According to the test fixture with the alarming function disclosed by the invention, the logic control device carries out operation judgment on operation signal and preset assembly service life of each assembly acquired by the data acquisition device, carries out pre-alarm and alarm prompting according to signal comparison results, prevents misjudgment of product quality caused by poor usability of a fixture assembly when electronic products are tested, and ensures the service life management and quality requirements on the tested fixture assembly.

Description

technical field [0001] The invention relates to a test fixture, in particular to a test fixture with an alarm function. Background technique [0002] During the entire production process of electronic products, fixtures are required to quickly fasten the workpiece, so that the machine tool, tool, and workpiece maintain the correct relative position, which is convenient for the processing or testing of electronic products. The test fixture mainly contacts the electronic products through the parts on the fixture to detect the function, quality, and production pass rate of the product. Parts mainly refer to test probes, radio frequency heads, USB data cables, gas springs, trigger switches, cylinders, etc. [0003] When the parts on the test fixture are used beyond the specified life, the following problems will occur: poor contact, warped contacts, insufficient elasticity, etc., which will mislead the test results of the quality of electronic products, for example: the radio f...

AI Technical Summary

Problems solved by technology

[0003] When the parts on the test fixture are used beyond the specified life, the following poor use problems will occur: poor contact, contact lift, insufficient elasticity, etc., which will mislead the test results of the quality of electronic products. If you continue to use it, you will misjudge the quality of the product due to poor contact; if you continue to use the USB data cable beyond its service life, the socket of the electronic product will be deformed due to the wear and tear of the connector

It can be seen that due to the neglect of the wear and tear of the parts, even if the quality of the parts is improved, the use effect of the test fixture may not be guaranteed

Images