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Non-contact magnetic particle inspection apparatus

A magnetic particle, non-contact technology, applied in the direction of material magnetic variables, etc.

Inactive Publication Date: 2012-10-17
GENERAL ELECTRIC CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

To form this visual indication, the defect must interrupt the flux lines to form a leaky field

Method used

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  • Non-contact magnetic particle inspection apparatus
  • Non-contact magnetic particle inspection apparatus
  • Non-contact magnetic particle inspection apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] refer to figure 1 , a non-contact magnetic particle inspection apparatus according to an exemplary embodiment is indicated generally at 2 . The particle inspection apparatus 2 comprises a test bed 4 having a frame 9 formed by an opposing first frame part 11 and a second frame part 12 joined to a third opposing frame part 12 on the frame part 13 and the fourth frame part 14 to jointly define the test area 18 . The frame 9 includes an inner channel 23 in which a magnetic field generator 25 is arranged. The magnetic field generator 25 includes a plurality of conductors, indicated at 28 , which extend around the test area 18 .

[0049] Further in accordance with the exemplary embodiment, the magnetic particle inspection apparatus 2 includes a test article support and handling system 34 that holds and positions the test article within the test zone 18 as will be discussed more fully below . The test article support and handling system 34 includes a first track 38 and a s...

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PUM

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Abstract

A non-contact magnetic particle inspection apparatus includes a test article support and manipulation system having a first rail that extends along a first axis, a second rail that extends along the first axis, and a third rail that extends a second axis. The third rail includes a first end that extends to a second end through an intermediate portion. The first end is mounted to the first rail and the second end is mounted to the second rail. A mounting fixture is mounted to the third rail. The mounting fixture includes a test article mounting system and a test article orientation system. The test article orientation system is configured and disposed to selectively manipulate a test article within a magnetic field.

Description

technical field [0001] The subject matter disclosed herein relates to the field of non-destructive testing systems, and more particularly, to non-contact magnetic particle inspection apparatus. Background technique [0002] Traditional manufacturing facilities require various forms of testing to ensure the quality of the finished product(s). Many manufacturing facilities utilize periodic sampling to ensure final quality. However, some industries require that each component leaving a production facility undergoes one or more quality assurance tests. Periodic sampling methods often employ destructive testing techniques to ensure quality. That is, one or more products are randomly selected from the production line and subjected to various tests. Testing will eventually result in damage to the product(s), but will provide data for controlling overall product quality. Industries that require testing of individual finished products cannot take advantage of destructive testing ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/82
CPCG01N27/87G01N27/84
Inventor R·W·伯格曼
Owner GENERAL ELECTRIC CO