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Alignment method and device using probes to touch and press line detection points of substrate

A technology of line detection and alignment device, which is applied to measurement devices, optical devices, measurement of electrical variables, etc., can solve problems such as easy generation of errors

Inactive Publication Date: 2012-11-07
姚福来
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, although the above-mentioned image sensor can correct the reference position of the substrate, since the above-mentioned detection mold is often replaced according to the model of the substrate, there is a gap between the reference position of the probe and the reference position of the detection point. The hidden worry of error needs to be improved urgently

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  • Alignment method and device using probes to touch and press line detection points of substrate
  • Alignment method and device using probes to touch and press line detection points of substrate
  • Alignment method and device using probes to touch and press line detection points of substrate

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Embodiment Construction

[0035] first look figure 1 As shown, reveals the flow chart of the first embodiment of the present invention, and coordinates Figure 2 to Figure 4 Explain that the alignment method of the present invention uses the probe to touch the detection point of the substrate circuit, including the following implementation steps:

[0036] In step S10, a receiving tray 2 capable of placing multiple substrates 9 to be tested is provided on a detection table 1, and the edge of the top surface of the substrate 9 has multi-circuit detection points 91 (with Image 6 shown); in this implementation, the top of the detection table 1 is provided with a first driver 6 connected to the receiving tray 2, the first driver 6 includes an upright rotating shaft 61 driven by a motor, and the receiving tray 2 is arranged on the top of the rotating shaft 61 , the first driver 6 can drive the receiving tray 2 to rotate by itself via the rotating shaft 61 .

[0037] In step S20, use an upper image sensor ...

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Abstract

The invention relates to an alignment method and a device using probes to touch and press line detection points of a substrate. The alignment method comprises pivoting a bearing tray for placing a substrate on a detection platform, wherein the substrate has multiple line detection points thereon; using an upper image sensor on the detection platform to sense the substrate from above the bearing tray, so as to correct the reference positions of the detection points; and using a lower image sensor on the detection platform to sense multiple probes at the bottom of a die from below a detection die following the movement of the upper image sensor, so as to correct the reference positions of the probes and the detection points.

Description

technical field [0001] The invention provides an alignment method using a probe to touch a detection point of a substrate circuit, and particularly relates to using a multi-image sensor to calibrate the reference positions of the probe and the detection point. The invention also relates to an alignment device implementing the method. Background technique [0002] The surface of the glass substrate that constitutes a liquid crystal display (LCD) or a touch panel (Touch Panel) is provided with a circuit pattern structure. It is connected with external control or driving circuits; in addition, after the circuit pattern structure is formed on the glass substrate, it is necessary to measure the resistance value and capacitance value of the circuit pattern structure through the detection points on the external wiring to judge The quality of the circuit pattern structure of the substrate. [0003] It is known that the detection equipment used to measure the circuit pattern structu...

Claims

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Application Information

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IPC IPC(8): G01B11/00G01R35/00
Inventor 姚福来
Owner 姚福来