Monitoring a system using optical reflectometry

A technology of optical reflection and monitoring system, which is applied in the direction of reflectometer, transmission system, and optical instrument test for detecting backscattered light in the time domain, and can solve problems such as power and signal-to-noise ratio limitations

Inactive Publication Date: 2012-12-19
ALCATEL LUCENT SAS
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  • Abstract
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Problems solved by technology

However, such an approach is mainly limited by power and signal-to-noise ratio

Method used

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  • Monitoring a system using optical reflectometry
  • Monitoring a system using optical reflectometry
  • Monitoring a system using optical reflectometry

Examples

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Embodiment Construction

[0037] refer to figure 1 , the optical reflectometer measurement device 10 is coupled to a system 15 in which the measurements have to be obtained. The device 10 includes: an excitation module 11 coupled to the system 15 so as to inject optical excitation signals into the system on a plurality of wavelength channels as indicated by arrow 13; Receive backscattered optical signals corresponding to the excitation signals. The coupling of the modules 11 and 12 to the system 15 may be made by power couplers or any other suitable means, such as optical circulators.

[0038] System 15 may comprise any optical system, especially an optical communication system, such as a passive optical network, or a part of such a system. In the remainder of this document, an embodiment is described in more detail in which system 15 is composed in part of Image 6 The two-way amplified WDM transmission line 20 depicted in the composition. The bidirectional line 20 can be used for longer distance ...

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Abstract

A method for monitoring a system using optical reflectometry comprises: receiving a first optical response signal coming from the system in response to a first optical excitation signal, said first excitation signal carrying a first numeric sequence (A), receiving a second optical response signal coming from the system in response to a second optical excitation signal, said second excitation signal carrying a second numeric sequence (1A, B), and determining correlations between said optical response signals and said numeric sequences in order to detect a singularity of the system. The first and second excitation signals are transmitted simultaneously within the optical system on separate carrier wavelengths ( [lambda] 0, [lambda] 1) by wavelength division multiplexing, and the first and second response signals are received simultaneously on said separate carrier wavelengths.

Description

technical field [0001] The present invention relates to the field of optical reflectometry measurements, in particular to measurements in which an optical excitation signal carrying a sequence of values ​​is transmitted within a system to be monitored so that the Correlate the scatter signal to monitor the system for anomalies. Background technique [0002] In optical systems, especially in telecommunication systems, optical reflectometry can locate anomalies such as heterogeneities, discontinuities, cracks, interfaces and other refractive index variations as they affect the backscatter of the optical signal. For these phenomena, a measurement technique known as Optical Time Domain Reflectometry (OTDR) was established. The purpose of the OTDR technique is to estimate the impulse response of the system to be monitored by sending an excitation signal into the system and measuring the backscatter response signal. can be approximated using the Dirac distribution Impulse exci...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00H04B10/08H04B10/071
CPCG01M11/3118H04B10/071G01M11/3127G01M11/00
Inventor C·多里策G·沙莱P·特兰
Owner ALCATEL LUCENT SAS
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