LED (Light Emitting Diode) performance test box, calibrating method and performance test method

A test box and performance technology, applied in the direction of testing optical performance, single semiconductor device testing, etc., can solve the problems of affecting test results, increasing manpower and time costs, and changing the performance of test samples, etc., to achieve simple operation, simple structure, and applicability Good results
CN102967446AActive Publication Date: 2013-03-13RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
Publication Date
2013-03-13

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Abstract

The invention discloses an LED (Light Emitting Diode) performance test box, a calibrating method and a performance test method. The test case comprises a box body and a light taking device, and also comprises a first motor, a second motor, a rotating shaft, an optical fiber and a connecting piece, wherein the box body is provided with a through hole, and the rotating shaft and the optical fiber pass through the through hole; the light taking device is arranged inside the box body; the first motor arranged outside the box body drives the rotating shaft to rotate; the fixing piece is fixed at the end of the rotating shaft located inside the box body, and the second motor is fixed on the connecting piece; the second motor drives the light taking device to approach or move away from the rotating shaft; and a first end of the optical fiber is connected with the light taking device, and a second end of the optical fiber is outside the box body. The LED performance test box is simple in structure, and easy and simple to operate, and can detect LED performance parameters on line.
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Description

technical field

[0001] The invention relates to the field of LED testing, in particular to an LED performance testing box, a calibration method and a performance testing method. Background technique

[0002] The currently prevailing LED reliability test method is: in the same model and batch of LED products, a certain number of samples are selected for testing, and their performance parameters are measured before and during the test, and calculated according to the corresponding lifetime algorithm. Model, LED life of the batch. Since the theoretical life of LEDs is tens of thousands of hours, it is necessary to use an intensive test method with enhanced stress to speed up the entire test process.

[0003] In order to improve efficiency and optimize test results, it is common practice to conduct reliability tests on multiple LED samples at the same time. In the existing LED reliability test system, a tray is usually sampled, multiple LED samples are fixed on the tray, and t...

Claims

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