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Test method for physical design similarity of circuit

A technology of physical design and similarity, applied in the fields of electrical digital data processing, computing, special data processing applications, etc., can solve problems such as difficulty in determining network similarity measurement

Inactive Publication Date: 2013-04-03
HUNAN UNIV
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Problems solved by technology

[0004] In order to solve the technical problem that current circuit physical design patent infringement determination and network similarity measurement are difficult to judge, the present invention provides a test method for circuit physical design similarity

Method used

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  • Test method for physical design similarity of circuit
  • Test method for physical design similarity of circuit
  • Test method for physical design similarity of circuit

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Experimental program
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Embodiment Construction

[0052] see figure 1 , figure 1 It is a flowchart of the present invention. Concrete implementation process of the present invention is as follows:

[0053] 1) Obtain the schematic diagram of the circuit and build a complex network model

[0054] see figure 2 Firstly, the components (or functional modules) in the circuit schematic diagram are abstracted as nodes, and the lines connected to the components are abstracted as edges connected to the nodes, that is, the circuit physical design is abstracted into a complex network by using the circuit schematic diagram.

[0055]The constructed complex network of circuits to be compared is described by the following set: G=(V,E), G'=(V',E'). Among them, G is the complex network corresponding to the original circuit physical design, G' is the complex network corresponding to the comparison circuit physical design, V is the set of nodes, and E is the set of edges.

[0056] 2) Calculate the characteristic parameters of the complex n...

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Abstract

The invention discloses a test method for physical design similarity of a circuit. The method comprises the following steps of: carrying out equivalence on components or modules in a circuit principle graph as nodes, carrying out equivalence on connection between components or modules, and building a complex network of circuit physical design; calculating the following four characteristic parameters of the complex network of circuit physical design: a node degree, node betweenness, a node cluster coefficient and a node average path length; and carrying out a Kolmogorov-Sirnov test of characteristic parameter accumulation distribution on a compared circuit physical design complex network, and obtaining overall similarity of each network characteristic parameter. By the adoption of the test method, according to complex network characteristics indicated by different circuit physical design, quantitative analysis on circuit physical design similarity is given out, and misjudgment brought by the affect of an subjective factor due to observation of a circuit design profile and the like in patent tort dispute of the circuit physical design is reduced.

Description

technical field [0001] The invention relates to a method for testing the similarity of circuit physical design. Background technique [0002] In recent years, various patent disputes in the communication field have continued, and litigation has become the norm in the industry. Of the seven patent infringement claims Apple filed against Samsung in April 2011, one involved the iPad's physical design. However, at present, whether the circuit hardware design is infringing is basically judged from the shape of the hardware, which affects the objective judgment of infringing acts and infringing products. Therefore, how to reasonably and quantitatively judge the similarity of IC product designs is a difficult problem to be solved urgently. [0003] The advantage of abstracting the physical design of the circuit into a complex network is that the surface structure of the physical design can be described by statistical methods using the relevant tools of graph theory. Recent resea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 彭敏放谭虎
Owner HUNAN UNIV
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