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Circuit system and test method for batch testing light-emitting diode life

A technology of light emitting diodes and circuit systems, applied in the field of life testing of light emitting diodes, can solve the problems of high cost, slow test speed, low precision, etc., and achieve the effects of low cost, fast test speed and reasonable circuit system structure

Active Publication Date: 2015-12-02
广州晶合测控技术有限责任公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Most of the existing life test equipment can only meet the test requirements of a small number of devices, and there are many problems, such as slow test speed, low precision, poor reliability and high cost

Method used

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  • Circuit system and test method for batch testing light-emitting diode life
  • Circuit system and test method for batch testing light-emitting diode life
  • Circuit system and test method for batch testing light-emitting diode life

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Embodiment 1

[0039] Such as figure 1As shown, the circuit system of this embodiment includes a computer, a digital output module, several test units, an address resolution module, a signal multiplexing module, and a digital voltmeter; the computer is connected to the digital output module; the control of the digital output module The signal output end is connected with the test unit, and the address signal output end is respectively connected with the address analysis module and the signal multiplexing module; the address analysis module is connected with the test unit through the signal bus; the enabling end and the input end of the signal multiplexing module and the output end are respectively connected with the address resolution module, the test unit and the digital voltmeter; the digital voltmeter is connected with the computer, and it adopts a differential measurement method to measure the voltage difference of the two test points at the same moment, namely output HI- output lo.

[...

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Abstract

The invention discloses a circuit system and a testing method for testing the service life of light emitting diodes in batches. The circuit system comprises a computer, a digital output module, a plurality of test units, an address analysis module, a signal multiplexing module and a digital voltage meter, wherein the computer is connected with the digital output module, the control signal output end of the digital output module is connected with test units, the address signal output end of the digital output module is respectively connected with the address analysis module and the signal multiplexing module, the address analysis module is connected with the test unit through a signal bus, the enabling end, the input end and the output end of the signal multiplexing module are respectively connected with the address analysis module, the test units and the digital voltage meter, and the digital voltage meter is connected with the computer. The circuit system disclosed by the invention is reasonable in structure and lower in cost, is capable of testing the service life of large-batch organic or inorganic light emitting diodes through the plurality of test units, and has the advantages of high testing speed, high precision and better reliability.

Description

technical field [0001] The invention relates to a circuit system and a test method for testing the life of light-emitting diodes, in particular to a circuit system and a test method for testing the life of light-emitting diodes in batches. It belongs to the field of life testing of light emitting diodes. Background technique [0002] At present, semiconductor light-emitting devices represented by organic light-emitting diodes (OLEDs) and inorganic light-emitting diodes (LEDs) are the most popular research objects in the new generation of lighting and display technologies. Green lighting devices represented by inorganic light-emitting diodes, with their High brightness, high efficiency, long life and other advantages are gradually replacing the existing incandescent lamps. The flat-panel display made of OLED devices has the advantages of ultra-thin, high brightness, energy saving and environmental protection, wide viewing angle, high response speed, bendable, etc. It has bee...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 罗建国王剑斌王磊吴为敬彭俊彪
Owner 广州晶合测控技术有限责任公司
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