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Constraint to components with high migration rate in electric connection

A technology for electrical connections and electrical connection points, applied in circuits, welding equipment, manufacturing tools, etc., can solve problems such as cost competition, increased costs, and unsatisfactory commercial applications

Inactive Publication Date: 2013-04-17
CUFER ASSET LTD LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

While this approach avoids this problem, it significantly increases the cost per connection, where cost competition is an issue, so this is unsatisfactory for commercial applications

Method used

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  • Constraint to components with high migration rate in electric connection
  • Constraint to components with high migration rate in electric connection
  • Constraint to components with high migration rate in electric connection

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Embodiment Construction

[0021] This application is related to a concurrently filed US Patent Application entitled "Recyclable Thermal Connection," the entire contents of which are hereby incorporated by reference as if fully set forth herein.

[0022] Our approach involves two aspects, each of which can be used alone or in combination with each other.

[0023] The first aspect involves the use of materials known as barriers under the joining metal, such as solder or alloys, to bind and / or attract mobile atoms in the joining metal. This is accomplished by selecting appropriate materials and by ensuring that the contact area and thickness (i.e. volume) of the barrier material is large relative to the solder or connection forming alloy (hereinafter often referred to as the "joint metal"), in the above mentioned combination In the case of columns and penetration connections as described in the application, the material will be ductile.

[0024] Alternatively, to the extent that the volume of the most mo...

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Abstract

The invention discloses a method for making electric contacts. A barrier material is arranged at an electric connection position, and a conductive connecting metal is arranged on the barrier material and has diffused mobile components, the size and the barrier material and the size of the diffused mobile components are selected, and the size of the barrier material is at least 20 percent of the combined size of the barrier material and the diffused mobile components. The electric connection comprises the conductive connecting metal between two contacts, the barrier material arranged on at least one side of the conductive connecting metal, and an alloy at an interface between the barrier material and the conductive connecting metal, wherein the alloy comprises at least partial barrier material, at least partial connecting metal and a mobile material.

Description

[0001] This application is a divisional application of the invention patent application 200880016621.1 filed on June 5, 2008, entitled "Restraining Components with High Mobility in Electrical Connections". technical field [0002] The present invention relates to semiconductors and, more particularly, to electrical connections for such devices. Background technique [0003] Typical solder balls for flip-chip die attach are made of 63% lead-37% tin. Just after reflow, which occurs as the last step in the conventional solder ball formation process and prior to attachment, the solder material is homogeneous in composition and consistency. figure 1 is an enlarged photograph of a cross-section of a typical solder ball 100 just after reflow. In this solder material very mobile tin ions are present. As a result, these tin ions will migrate in the solder over time. Even at moderate temperatures, the migrating ions will tend to clump together, causing the lead and tin to undergo p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/60B23K35/30
Inventor 约翰·特雷扎
Owner CUFER ASSET LTD LLC