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Spectroscopic method and device for quickly testing type II infrared superlattice interface quality

A technology of interface quality and infrared ultrasonography, which is applied in the fields of emission spectrum, spectrum investigation, material excitation analysis, etc.

Active Publication Date: 2015-02-18
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, for material growth personnel, the above two techniques have great limitations in application

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  • Spectroscopic method and device for quickly testing type II infrared superlattice interface quality
  • Spectroscopic method and device for quickly testing type II infrared superlattice interface quality
  • Spectroscopic method and device for quickly testing type II infrared superlattice interface quality

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Embodiment Construction

[0025] The following is based on figure 1 and figure 2 The embodiments of the present invention are given and described in detail to better illustrate the technical features and functional characteristics of the present invention, rather than to limit the scope of application of the present invention.

[0026] Specific implementations such as figure 1 As shown, the device for quickly detecting the quality of type II superlattice interface based on PL spectrum under a magnetic field includes a Fourier transform infrared spectroscopy system 1, which has an optical interference component 101, and a detector 102 connected with the optical interference component for detecting The signal processing circuit control board 103 and the console computer 104; the light modulation device 2, which includes a mechanical chopper 201 and a lock-in amplifier 202, the frequency signal of the mechanical chopper 201 is connected to the reference terminal of the lock-in amplifier 202, and the loc...

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Abstract

The invention discloses a spectroscopic method and a device for quickly testing type II infrared superlattice interface quality. The spectroscopic device comprises a Fourier transform infrared measuring system which has a function of step scan, a laser device which serves as a pump light source, a temperature-changing and magnetic-field-changing sample measuring system, a phrase lock amplifier which connects a detector and a circuit control panel in the Fourier transform infrared measuring system, and a wave chopper which is arranged between the temperature-changing and magnetic-field-changing sample measuring system and the laser device. With the spectroscopic device being used, the type II infrared superlattice interface quality is quickly tested through measuring the degree of attenuation of the photoluminescence intensity of type II infrared superlattices along a magnetic field. The test for infrared band In As / Ga Sb type II infrared superlattices of molecular beam epitaxy indicates that the spectroscopic method for quickly testing the type II infrared superlattice interface quality is an optical method capable of quickly and conveniently testing type II infrared superlattice interfaces. The spectroscopic method for quickly testing the type II infrared superlattice interface quality has the advantages of being lossless and sensitive, and is especially suitable for the detection of weak optical signals on the type II infrared superlattice interfaces.

Description

Technical field: [0001] The invention relates to a spectroscopic method and device for rapidly detecting the interface quality of type II infrared superlattice. Specifically, it mainly uses the step-scan mode of Fourier transform infrared spectrometer (FTIR) to realize the photoluminescence measurement method and device of type II infrared superlattice under magnetic field, so as to quickly judge the interface of type II infrared superlattice quality. Background technique: [0002] Infrared detectors play an important role in both military and civil applications, especially the detection of mid- and far-infrared bands, which is of great significance in space technology, satellite positioning, and remote sensing. In the past few decades, the material of far-infrared detectors was mainly mercury cadmium telluride, but in recent years, type II superlattice represented by InAs / GaSb has attracted people's attention and played an increasingly important role in infrared detection....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/63G01J3/443
Inventor 邵军陈熙仁吕翔朱亮祁镇
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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