A method for converting multiple test channels in a test system

Abstract

The invention discloses a conversion method of multiple testing channels of a testing system. The conversion method of the multiple testing channels of the testing system includes that a switch used for judging if the testing channels are ready or not is installed at a tail end of each testing channel of the testing system. A queue for starting testing orders and storing all testing channels of the testing system is set up. Firstly, whether each testing channel of the testing system is ready or not is sequentially judged. If yes, orders to start tests of the testing channels which are ready are stored in the queue for starting the testing orders and the process is repeated at intervals. Secondly, an order to start a test is abstracted from the queue for starting the testing orders and a test of a corresponding channel is started. After the test is finished, the next order to start a test is abstracted from the queue for starting the testing orders and the process is repeated in the same way, wherein the first step and the second step work individually. Automatic conversion of the testing systems of the testing system is achieved through data coordination of the queue for stating the testing orders. By means of the conversion method, automatic conversion of multiple testing channels of the testing system of electronic products is achieved and utilization efficiency of testing instruments is improved.

Description

technical field [0001] The invention relates to the field of electronic product testing, in particular to a method for automatically switching multiple testing channels in an electronic product testing system. Background technique [0002] At present, most of the testing methods for electronic products are to use the characteristics of the physical size and electronic characteristics of the mass-produced products. The method of testing the mold is used to put the tested product into the testing mold to realize the quick connection with the testing instrument and other equipment. Computer integrated control is used to complete various parameter tests. Due to the high cost of testing instruments, due to the consideration of factors such as cost and equipment volume, almost all use a single set of testing instruments with channel switching to realize the pipeline testing of multiple products. [0003] This method is widely used and is more suitable for multi-PCB board-to-board...

AI Technical Summary

Problems solved by technology

If the traditional pipeline test mode is still used, that is, the test is performed in the order of A->B->C->D->A->…, each pipeline will judge each channel one by one, such as figure 2 The flow shown, if any one or more of the channels are not used, this kind of work is unnecessary and wastes time

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