Supercharge Your Innovation With Domain-Expert AI Agents!

Capacitors and how to form them

A technology of capacitance and conductive layer, applied in the direction of circuits, electrical components, electric solid devices, etc., can solve the problems of increasing manufacturing costs and achieve the effect of large capacitance and large surface area

Active Publication Date: 2016-08-24
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is to say, the number of layers of the polysilicon layer is equal to the number of times of patterning, the more layers, the more times of patterning, and each time of patterning requires a photolithography process, which increases the manufacturing cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitors and how to form them
  • Capacitors and how to form them
  • Capacitors and how to form them

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] The inventor obtains a new capacitance forming method through creative work.

[0058] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. When describing the embodiments of the present invention in detail, for convenience of explanation, the schematic diagrams will not be partially enlarged according to the general scale, and the schematic diagrams are only examples, which shall not limit the protection scope of the present invention. In addition, the three-dimensional space dimensions of length, width and depth should be included in actual production.

[0059] refer to Image 6 , and combined with the reference Figure 5 , performing step S51 , providing a semiconductor substrate 100 , and forming a first trench 101 in the semiconductor substrate 100 . In a specific embodiment, a plur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Provided are a capacitor and a forming method thereof. The forming method of the capacitor includes: forming a first groove in a substrate; forming a first medium layer covering the substrate and a lateral wall and the bottom of the first groove; forming a first electric conduction layer covering the first medium layer and a first sacrificial layer arranged on a lateral wall of the first electric conduction layer; repeating the steps of forming the first electric conduction layer and the first sacrificial layer, and forming a plurality of first electric conduction layers and first sacrificial layers on the first medium layer sequentially; removing a plurality of electric conduction layer portions and first sacrificial layer portions higher than the surface of the first electric conduction layer at the bottom layer on a semi-conductor substrate; removing the remaining plurality of first sacrificial layer portions to form a plurality of second grooves; and forming a second medium layer and a top electric conduction layer on the second medium layer, covering a middle electric conduction layer, and filling the plurality of second grooves. Capacitance of the whole formed capacitor is large, and by means of the forming method, the number of used photoetching masks is reduced, and production cost is obviously reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a method for forming a capacitor and the capacitor. Background technique [0002] In addition to using transistors as active devices in integrated circuits, capacitors are often used as passive devices in semiconductor devices. For example, in integrated circuit design, a large-capacity capacitor is usually used as a decoupling capacitor, and the decoupling capacitor is equivalent to a battery to avoid a voltage drop due to a sudden change in current. Specifically, the capacitance C=εS / d, and the capacitance C is proportional to the surface area S of the capacitor plate, so a larger surface area of ​​the plate is required to manufacture a large-capacity capacitor. [0003] While integrated circuit design and development using capacitors is common, capacitors, like other active devices, are affected by the continuing need to shrink device and structure dimensions while inc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02H01L23/64
Inventor 莘海维
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More