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Contact device for aging test equipment and aging test equipment

A technology for aging testing and contacting devices, which is applied in the direction of measuring devices, measuring device casings, single semiconductor device testing, etc. It can solve the problems of rising production costs and achieve the effects of saving production costs and reducing damage

Active Publication Date: 2016-12-28
UNITEST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] However, according to the prior art, a plurality of servo motors are also used to move the test board, so there is a problem that high-precision synchronization is required and production cost increases

Method used

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  • Contact device for aging test equipment and aging test equipment
  • Contact device for aging test equipment and aging test equipment
  • Contact device for aging test equipment and aging test equipment

Examples

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Embodiment Construction

[0022] Hereinafter, preferred embodiments of the present invention as described above will be described with reference to the accompanying drawings, but repetitive descriptions will be omitted or compressed as much as possible for the sake of brevity.

[0023]

[0024] figure 1 It is a perspective view schematically showing a contact device 140 for burn-in testing equipment (hereinafter simply referred to as "contact device") according to an embodiment of the present invention.

[0025] The contact device 140 of this embodiment includes a holding plate 141 , a first drive source 142 , a power conversion transmission device 143 , a second drive source 144 and the like.

[0026] The holding plate 141 is configured to be able to advance and retreat toward the test substrate side, and is used to move the held test board to the test substrate side or to move it in the opposite direction. A plurality of connection grooves 141a are formed on this holding plate 141 for connecting t...

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PUM

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Abstract

The invention relates to a buin-in tester. Technology is disclosed according to the present invention, that is a driving source is used for driving a test board to advance and retreat toward one side of a test base, thereby realizing synchronous advancement and retreat of both ends of the test board and preventing a connector on the test board from getting damaged.

Description

technical field [0001] The present invention relates to burn-in testing equipment (Burn-In Tester) for testing the reliability of semiconductor components against thermal stress when the semiconductor packaging components are powered on to make them work. Background technique [0002] After the semiconductor element is manufactured, it undergoes various tests. The burn-in test of the present invention is a test to confirm the degree to which the semiconductor element can resist thermal stress when an electrical signal is applied to the semiconductor element to make it work. And, the device that implements this aging test is the aging test equipment. [0003] Burn-in test equipment includes a burn-in chamber for storing semiconductor elements and a test chamber for holding test substrates. After the test signal is connected to the semiconductor elements stored in the burn-in chamber, the test substrate is used to read the results of feedback (Feedback) Signal. [0004] Gene...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/26
CPCG01R31/2862G01R31/2863G01R31/2867G01R31/2874G01R31/2879G01R31/2896
Inventor 金进熙白珉昇
Owner UNITEST