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Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation

A technology of anti-skid braking and temperature change, applied in the direction of electrical testing/monitoring, etc., can solve the problems of limitation, rarely introduce reliability enhancement test equipment, etc., and achieve the effect of improving welding quality

Inactive Publication Date: 2015-05-13
XIAN AVIATION BRAKE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0017] State-owned enterprises rarely introduce reliability enhancement test equipment, and the promotion of this method is limited by insufficient equipment

Method used

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  • Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation
  • Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation
  • Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0079] This embodiment is a method for testing the anti-skid brake control box of a certain type of transporter under the condition of rapid temperature change.

[0080] The concrete steps of this embodiment are:

[0081] Step 1, determine the high temperature value of the rapid temperature change test of the antiskid brake control box

[0082] A method for testing the damage limit of the anti-skid brake control box by applying high-temperature step stress and working stress to the anti-skid brake control box. The improved high-temperature damage limit of the anti-skid brake control box described in this embodiment is greater than 115°C;

[0083] Determine the high temperature value of the rapid temperature change in the comprehensive environmental test chamber. The high temperature value of the rapid temperature change is 5°C to 10°C lower than the high temperature damage limit. The high temperature value taken in this example is 110°C, which is 5°C lower than the high temper...

Embodiment 2

[0121]Embodiment 2 and embodiment 3 all comprise the high temperature numerical value of determination antiskid brake control box quick temperature change test, determine the low temperature numerical value of antiskid brake control box quick temperature change test, determine the numerical value of rapid temperature change rate, determine the antiskid brake during the test process. The operating current applied by the control box, determining the temperature retention time of the anti-skid brake control box under high temperature and low temperature conditions, formulating the rapid temperature change test profile, conducting tests according to the rapid temperature change test profile, and verifying the improved anti-skid brake control box Each step, its specific process is the same as that of Example 1, except that the test data in Example 2 and Example 3 are different from that of Example 1, as shown in Table 3 for details.

[0122] The main test data of 3 embodiments are s...

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Abstract

The invention discloses a method for testing potential safety risks of antiskid braking control boxes by the aid of quick temperature variation. The method includes determining high-temperature numerical values of an antiskid braking control box in quick temperature variation tests; determining low-temperature numerical values of the antiskid braking control box in the quick temperature variation tests; determining a quick temperature variation rate; determining working currents applied to the antiskid braking control box in test procedures and determining temperature holding durations of the antiskid braking control box under high-temperature and low-temperature conditions; establishing a quick temperature variation test profile according to a determined high temperature of a test chamber, a determined low temperature of the test chamber and a determined temperature variation rate of the test chamber; performing five cycle quick temperature variation tests according to the established test profile; comprehensively applying an antiskid braking working current to truly stimulate potential failure risks of the antiskid braking control box. The method has the advantages that the comprehensive environmental test chamber is utilized, the temperatures are accessorily controlled via liquid nitrogen, the potential failure risks of the antiskid braking control box during temperature variation can be stimulated within two days, and accordingly purposes of improving the development efficiency, saving energy and reducing consumption are achieved.

Description

technical field [0001] The invention relates to the field of electronic products of the braking system of a transportation aircraft, in particular to a method for testing hidden troubles of an anti-skid brake control box under the condition of rapid temperature change. Background technique [0002] One of the contents of highly accelerated life test is to stimulate and correct the potential failure of electronic products under the condition of rapid temperature change. [0003] The anti-skid brake control box is an electronic product in the aircraft anti-skid brake system. It is designed with the function of braking on the take-off line, the anti-skid function during landing braking, the grounding protection function during landing, and the inter-wheel protection of the left and right landing gear wheels during landing. and other functions, any function that does not meet the design requirements is a failure. [0004] Rapid temperature change conditions are often encountere...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02
Inventor 乔建军柯少昌
Owner XIAN AVIATION BRAKE TECH
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