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Phase change memory and manufacturing method thereof

A technology of phase change memory and manufacturing method, which is applied in the field of phase change memory and its manufacture, can solve the problems of false phase change pads peeling off and cannot be improved, and achieve the effect of improving easy peeling off

Active Publication Date: 2013-09-11
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

What is more serious is that even when the concentration of the cleaning solution is as small as 3000:1 (volume ratio of water to HF acid), the problem of peeling off of the pseudo-phase-change mat cannot be improved.

Method used

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  • Phase change memory and manufacturing method thereof
  • Phase change memory and manufacturing method thereof
  • Phase change memory and manufacturing method thereof

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Embodiment Construction

[0054] The problem to be solved by the present invention is to provide a method for manufacturing a phase change memory, so as to prevent the false phase change pad from peeling off during the cleaning process after the phase change material layer is etched.

[0055] In order to solve the above problems, the inventors found that when the pseudo-phase-change pad is divided into multiple parts with intervals between each other, the adhesion between the pseudo-phase-change pad and the underlying dielectric layer will be significantly enhanced, effectively improving The problem that the pseudo-phase-change pad is easy to peel off during the cleaning process after the etching of the phase-change material layer is solved.

[0056] The technical solution of the present invention will be described clearly and completely through specific embodiments below in conjunction with the accompanying drawings. Apparently, the described embodiments are only a part of the possible implementation m...

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Abstract

Provided are a phase change memory and a manufacturing method of the phase change memory. The manufacturing method of the phase change memory comprises the steps of (1) providing a semiconductor substrate which comprises a first area and a second area, (2) carrying out deposition to form a dielectric layer, forming a bottom electrode in the dielectric layer on the second area of the semiconductor substrate, (3) carrying out deposition to form a phase change material, carrying out etching on the phase change material, forming an imaging phase change material layer at the position, corresponding to the bottom electrode, of the upper portion of the dielectric layer, forming fake phase change pads at the partial position corresponding to the first area of the semiconductor substrate, wherein a gap exists between the imaging phase change material layer and each fake phase change pad, each fake phase change pad at least comprises two portions, and a gap exists between every two adjacent portions, and (4) carrying out cleaning processing on the semiconductor substrate after the fake phase change pads are formed. Due to the facts that the fake phase change pads are divided into a plurality of portions, and the gap exists between every two adjacent portions, the problem that the fake phase change pads are easy to peel off in the process of cleaning processing after etching of the phase change material is effectively solved.

Description

technical field [0001] The invention belongs to the field of microelectronics manufacturing, and in particular relates to a phase-change memory and a manufacturing method thereof. Background technique [0002] Phase Change Memory (PCM) has the characteristics of high read speed, low power, high capacity, high reliability, high rewritable times, and low operating voltage, and is very suitable for combining with CMOS technology, and can be used as a relatively High-density stand-alone or embedded memory applications are currently very promising next-generation memories. Due to the unique advantages of phase change memory technology, it is also considered very likely to replace the current highly competitive volatile memory (Volatile Memory) such as SRAM and DRAM and non-volatile memory (Non-volatile Memory) such as Flash. It is expected to become a new generation of semiconductor memory with great potential in the future. [0003] Phase-change memory uses the difference in r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L45/00
Inventor 刘焕新
Owner SEMICON MFG INT (SHANGHAI) CORP