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A Calculation Method of Microwave Radiation Brightness Temperature on Undulating Lunar Surface

A technology of microwave radiometer and calculation method, which is applied in the field of microwave remote sensing, and can solve problems such as the influence of microwave radiation brightness temperature on lunar soil

Inactive Publication Date: 2016-03-02
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0005] In view of the above defects or improvement needs of the prior art, the present invention provides a calculation method for the brightness temperature of microwave radiation on the undulating lunar surface, the purpose of which is to solve the problem of ignoring the influence of terrain fluctuations on the brightness temperature of microwave radiation of lunar soil in the existing models question

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  • A Calculation Method of Microwave Radiation Brightness Temperature on Undulating Lunar Surface

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[0115] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0116] The overall idea of ​​the present invention is: the present invention models the rough surface of the terrain, and by defining the concept of "average effective solar irradiance" on the rough surface, the temperature of the lunar soil with the relief (including large-scale and small-scale) The profile calculation is transformed into the temperature profile calculation of the plane layered m...

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Abstract

The invention discloses a calculation method for undulating lunar surface microwave radiation brightness temperature. The calculation method comprises the steps: 1, microwave data parameters of the lunar surface are obtained and calculated by utilizing plane fitting, coordinate conversion and the shadowing function, so that the effective solar irradiance on the lunar surface is obtained; 2, the temperatures T of different depths of the lunar soil are obtained according to the physical parameters of the lunar soil, the effective solar irradiance obtained in the step 1, the heat conduction theory and the hierarchical model of the lunar soil; 3, the brightness temperature of the lunar surface is calculated according to the temperature profile obtained in the step 2, the burke multi-layer planar hierarchical brightness temperature model and the electromagnetic wave polarization theory. According to the calculation method, the technical problem that influence of the undulating landform to the lunar soil microwave radiation brightness temperature is neglected in an existing model is solved.

Description

technical field [0001] The invention belongs to the field of microwave remote sensing, and more specifically relates to a method for calculating the brightness temperature of microwave radiation on the undulating lunar surface. Background technique [0002] One of the important scientific tasks of "Chang'e-1" (CE-1) and "Chang'e-2" (CE-2) in lunar exploration is to record the data of the brightness and temperature of the microwave radiation of the lunar soil, so as to invert the thickness of the lunar soil layer, and here Based on the evaluation of the content of helium 3 resources on the moon. The study of lunar soil thickness is an important content of lunar soil research, which is of great significance to future lunar exploration, manned moon landing, lunar base site selection, and development and utilization of lunar resources. In order to improve the accuracy of retrieving the thickness of the lunar soil, it is first necessary to establish an accurate forward model of ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/06
Inventor 陈萍黄全量张莉娟何燕春王丛丛刘杰娜华蕾李青侠
Owner HUAZHONG UNIV OF SCI & TECH
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