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Method for calculating the concentration of disturbed elements from the measured intensities and concentrations of the elements

A technology for interfering elements and element concentrations, applied in the application field of spectral analysis technology, can solve problems such as non-spectral interference, systematic errors, calculation errors, etc., and achieve the effects of low production cost, improved accuracy, and improved analysis precision.

Active Publication Date: 2019-09-17
TIANJIN JINGLIWEI SCI & TECH
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Problems solved by technology

[0008] 2. Non-spectral interference
[0032] However, there are shortcomings in the above-mentioned traditional model. Since the intensity variable in the model itself is not a net signal, it has systematic errors. Therefore, in actual analysis, such calculations in the model may cause further errors, and sometimes even cause out of control

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  • Method for calculating the concentration of disturbed elements from the measured intensities and concentrations of the elements
  • Method for calculating the concentration of disturbed elements from the measured intensities and concentrations of the elements
  • Method for calculating the concentration of disturbed elements from the measured intensities and concentrations of the elements

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Embodiment Construction

[0058] The present invention is specifically described below in conjunction with accompanying drawing, as figure 1 It is a structural schematic diagram of the method for calculating the concentration of disturbed elements through the measured intensity and concentration of elements described in the present invention. As shown in the figure, a method for calculating the concentration of disturbed elements through the measured strength and concentration of elements includes the following two A correction model:

[0059] (1) Line overlap correction model: Among them, I i is the measured intensity of the interfered element, Ic is the net intensity of the interfered element without interference, K j is the overlapping interference coefficient, C ij Be the concentration of the jth interfering element with superimposed interfering properties in the 1st block standard sample, m is the number of possible interfering elements in the same block of standard sample;

[0060] (2) Line ...

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Abstract

The invention discloses a method for calculating a concentration of an interfered element through measurement intensity and concentration of an element. The method comprises the following two correction models: (1) spectra overlap correction model and (2) spectra overlap-self-absorption correction model. The method has the beneficial effects of high analytical precision and good stability.

Description

technical field [0001] The invention relates to the application field of spectral analysis technology, in particular to a method for calculating the concentration of disturbed elements through the measured intensity and concentration of elements. Background technique [0002] Under the action of external energy (electric energy), the electrons of the elements in the sample undergo transitions after absorbing energy. From a low energy level to a high energy level, electrons in a high energy state are in an unstable state, and energy is released during the process from a high energy state to a low energy state. , this energy will manifest itself in the form of light, forming the spectrum of the element. [0003] Namely: δE=E 2 -E 1 =hν=hc / λ [0004] The energy level of the spectrum corresponds to the level of the element concentration in the analyzed sample, and the composite light is decomposed into the spectrum of a single element through the optical component grating. S...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/66
Inventor 马增
Owner TIANJIN JINGLIWEI SCI & TECH