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Exhaust electron testing system and method for a dielectric protective film material

A technology of dielectric protective film and escaping electrons, applied in measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve the problems of expensive equipment, affecting the accuracy of test results, and large ambient current noise, and reduce the difficulty of testing. , Eliminate adverse effects, and apply a wide range of effects

Active Publication Date: 2015-12-30
江苏乐士源新能源科技有限公司
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AI Technical Summary

Problems solved by technology

This nA-level current test requires professional equipment, which is not only expensive, but also easily affected by the large current generated by the alternating maintenance discharge of the device itself, and the phenomenon of alternating current overload appears continuously; especially the escape current itself is very Small, but the environmental current noise is relatively large, the test data is easily obliterated by the environmental noise, and it is difficult to obtain accurate measurement values
In some patents, the method of connecting an external resistor with a large resistance to the addressing electrode A and measuring the outgoing electron current through the voltage drop of the resistor will also affect the accuracy of the test result due to the accuracy of the resistor itself and the distributed capacitance.
[0011] The deviation of the test results of the existing direct test method for outgoing electrons will have a certain impact on the application of dielectric film protection materials. It is necessary to find a more accurate and practical test method to realize the precise measurement of the outgoing electrons of the display unit.

Method used

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  • Exhaust electron testing system and method for a dielectric protective film material
  • Exhaust electron testing system and method for a dielectric protective film material
  • Exhaust electron testing system and method for a dielectric protective film material

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Embodiment Construction

[0051] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0052] A method for testing the escaped electrons of a dielectric protective film material of the present invention, such as Figure 5 As shown, it includes at least one cycle period T for testing, and the cycle period T includes the following voltage application periods carried out successively in sequence,

[0053] 1) Excitation period T s ; Alternately apply at least one discharge period T on the sustain electrode X and scan electrode Y of the plasma display screen under test c The excitation voltage, during a discharge cycle T c The internal working gas completes at least one discharge process; the excitation voltage is not less than the ignition voltage V required for the discharge of the working gas in the plasma display screen under test f ; Thus, a VUV gas discharge for exciting ex...

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Abstract

The invention relates to an exoelectron testing system and method for a medium protecting film material. At least one circulation period T used for testing is included, and the circulation period T comprises the following voltage application periods of (1) an excitation period Ts, (2) a waiting period Tw and (3) a testing period TR, wherein (1) the excitation period Ts, (2) the waiting period Tw and (3) the testing period TR are carried out consecutively in sequence. Optical signals generated by the working gas discharging process inside a display unit in a detected plasma display screen in the testing period are detected and recorded, the testing voltage difference VD between a scanning electrode Y and a maintenance electrode X when the optical signals generated is obtained simultaneously, the voltage Vw of an internal field in the display unit is calculated and obtained by the equation Vw=Vf-VD, the amount of exoelectrons in the display unit is calculated and obtained through the Vw, and one test of the exoelectrons of the medium protecting film material is completed. The exoelectron testing system for implementing the testing method for the medium protecting film material comprises a drive circuit, a photomultiplier counter tube, an oscilloscope, a computer, a control circuit and a power circuit.

Description

technical field [0001] The invention relates to the technical field of using gas discharge to measure tiny electrons, in particular to a testing system and method for the escaped electrons of a dielectric protective film material. Background technique [0002] Dielectric protective film materials are widely used in space, military industry, image enhancement, measurement and other fields due to their high sputtering resistance, long life, and high secondary electron emission characteristics. Among them, the application of the dielectric protective film in the plasma display (PDP, Plasma Display Panel) is particularly important. PDP mainly uses ultraviolet light generated by gas discharge to excite phosphors to emit light to realize the display of characters and images. According to different driving voltages and display units, plasma displays are classified into DC and AC discharge types. At present, the AC plasma display mainly adopts the addressing and display separation...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00G01R19/10
Inventor 韦海成张秀霞毛建东
Owner 江苏乐士源新能源科技有限公司
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