Data acquisition device, online simulation debugging system and method

Abstract

The present invention relates to a data collection device, an online simulation debugging system and a method. The device includes: a collection control circuit, used to control the collection of data by the collection circuit according to the previously set port data collection parameters; Collect the data of corresponding time period under the control of acquisition control circuit; And transfer the collected data to the micro-processing unit internal RAM; Wherein, the acquisition circuit includes a port selection circuit for selecting a sampling port, for selecting a trigger port The clock selection circuit of the clock and the sampling clock and the data acquisition and transmission circuit for storing the port data of the micro-processing unit and sending them to the internal random memory of the micro-processing unit.

Description

technical field [0001] The present invention relates to the field of simulation debugging of micro-processing units or embedded systems, in particular to an online simulation debugging system and method for realizing monitoring of a micro-processing unit port for a period of continuous time in low-cost and simple online simulation debugging, and the data used for monitoring acquisition device. Background technique [0002] In the prior art, the logic analysis circuit in the FPGA can realize the collection of port data for a period of time. Such as figure 1 Shown is one of the structural block diagrams of the data acquisition device in the prior art. The logic analysis circuit of the data acquisition device is composed of a state machine circuit, a counting circuit, a multiplex circuit, a register and a storage circuit, such as figure 2 Shown is the second structural block diagram of the logic analysis circuit in the data acquisition device in the prior art. The logic an...

AI Technical Summary

Problems solved by technology

In this case, additional test equipment is required, which increases the cost and complexity of debugging; in addition, the use of test equipment is affected by the complexity of the circuit system of the micro-processing unit under test

If the circuit system of the micro-processing unit to be tested is relatively complex, there will be a situation where the probe of the test equipment cannot be connected to the chip port for testing, so that the debugging cannot be carried out; in addition, the test equipment itself will have a certain influence on the circuit, such as testing The probe itself has a capacitive effect, which will affect the timing of the microprocessing unit port

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