Generalized Distributed Test System Architecture

A test system and distributed technology, applied in the direction of software testing/debugging, can solve problems such as poor real-time performance, low test efficiency, and poor versatility, achieve system bandwidth requirements and pressure reduction, improve test equipment utilization, and reduce uncertainty. sexual effect

Active Publication Date: 2016-01-20
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] The purpose of the present invention is to solve the shortcomings of low test efficiency, poor real-time performance and poor versatility in the current centralized automatic test system architecture and distributed test system architecture. The present invention provides a generalized distributed test system architecture

Method used

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specific Embodiment approach 1

[0038] Specific implementation mode one: combine figure 2 Describe this embodiment, the generalized distributed testing system framework described in this embodiment, it comprises system layer, network connectivity layer and instrument layer;

[0039] The system layer includes a test resource description layer, a test signal mapping layer and a test equipment connectivity layer;

[0040] The test resource description layer is used to describe the system components and generate ATML description files;

[0041] Described ATML description file comprises test task ATML description file, test equipment ATML description file, test station ATML description file and tested equipment ATML description file;

[0042] The test signal mapping layer includes a test task management module, a test resource analysis module, a signal mapping module, a trigger resource analysis module, a test task decomposition module and a test task generation module;

[0043] The test task management module...

specific Embodiment approach 2

[0075] Embodiment 2: This embodiment is a further limitation of the generalized distributed test system architecture described in Embodiment 1. The test resource description layer includes a graphical TPS development module, a test description generation module, a test equipment discovery module, a test Result management module, test station description generation module and adapter description generation module;

[0076] Graphical TPS development module, used to edit test tasks with graphical tools, describe test signals and test procedures of test tasks, and generate graphical TPS for test tasks;

[0077] The test description generation module is used to convert the graphical TPS of the generated test task into the ATML description file of the test task;

[0078] A test equipment discovery module, used to discover effective automatic test equipment, and obtain the test equipment ATML description file of the automatic test equipment;

[0079] The test result management modul...

specific Embodiment approach 3

[0090] Embodiment 3: This embodiment is a further limitation of the generalized distributed test system architecture described in Embodiment 1 or 2. The test device connection layer includes a test process management module, a test subtask delivery module, a test A result listening module and a virtual device agent module;

[0091] The test process management module is used to monitor the execution of multiple ATML test subtasks and control the execution process of the corresponding tasks according to the returned ATML test results. It is also used to control the execution of multiple ATML test subtasks Normal operation without mutual interference;

[0092] The test subtask delivery module is used to deliver multiple ATML test subtasks to the corresponding test equipment;

[0093] The test result listening module is used to receive and save the ATML test results conforming to the ATML specification according to the requirements of the test task for the test results;

[0094]...

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Abstract

A universal distributed test system framework belongs to the field of automatic test, and aims to solve the problems of low test efficiency, and bad real-time performance and universality of a conventional centralized automatic test system framework and a conventional distributed test system framework. The universal distributed test system framework comprises a system level, a network communicating level and an instrument level; the system level uses a test computer as a carrier, and comprises software tools and user interfaces, which are required for managing, developing and performing test diagnosis tasks; the network communicating level adopts standard LXI interfaces to integrate each test equipment and provide information interaction media; the instrument level mainly adopts intelligent instruments supporting the LXI interfaces for providing a test diagnosis function. The information interaction format between the system level and the instrument level, as well as between the system level and the network communicating level, all follows the ATML standard set. The universal distributed test system is used for constructing an automatic test system.

Description

technical field [0001] The invention relates to a test system architecture, which belongs to the field of automatic test. Background technique [0002] The automatic test system (Automatic Test System, ATS) with computer technology as the core is an important guarantee for the realization of electronic equipment fault diagnosis, health management and functional testing. Since the 1970s, ATS has generally experienced four development stages: dedicated ATS, rack-stacked ATS, backplane-based modular ATS, and open system architecture ATS. While forming mature technology and serialized products, the problems of ATS test program set (TestProgramSet, TPS) portability (Transportability), test equipment interoperability (Interoperability), and interchangeability (Inter-changeability) have become increasingly prominent, and have been The cost of testing in the whole life cycle of test equipment development, production, deployment and maintenance has expanded rapidly. The generalizat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 刘兆庆乔立岩彭喜元
Owner HARBIN INST OF TECH
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