Method and device for selecting characteristics based on neural network sensitivity

A feature selection method and neural network technology, applied in the field of learning sample feature selection, can solve the problems of small deviation, large amount of calculation, inappropriate for large data sets, etc., to improve performance, reduce time and cost, and improve generalization ability. Effect

Inactive Publication Date: 2014-03-26
HOHAI UNIV
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Encapsulation uses the training accuracy of the follow-up learning algorithm to evaluate the feature subset, with small deviation and large amount of calculation, which is not suitable for large data sets

Method used

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  • Method and device for selecting characteristics based on neural network sensitivity
  • Method and device for selecting characteristics based on neural network sensitivity

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Embodiment Construction

[0026] Below in conjunction with specific embodiment, further illustrate the present invention, should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various equivalent forms of the present invention All modifications fall within the scope defined by the appended claims of the present application.

[0027] Taking a multilayer perceptron neural network as an example, the method for selecting samples of a feedforward neural network according to the present invention is described. However, those skilled in the art should understand that the present invention is not limited to MLP neural networks, but can be applied to other feed-forward neural networks.

[0028] MLP is a fully connected feed-forward neural network suitable for object classification. The structure of the MLP is as figure 1 As s...

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Abstract

The invention discloses a method and device for selecting characteristics based on neural network sensitivity, and belongs to the field of machine learning in intelligent science and technologies. The method and device are based on the sensitivity, the characteristics high in sensitivity are selected to search for the characteristics with output greatly changed when disturbance happens to the characteristics, and the characteristics are important to a training classifier. The method and device can effectively select the sample characteristics important to the training classifier, and therefore the performance of the classifier is improved.

Description

technical field [0001] The present invention relates to a learning sample feature selection method and its device during neural network design, in particular to a learning sample feature selection method and device based on feature selection that can effectively improve the neural network classification efficiency, and belongs to machine learning in intelligent science and technology field. Background technique [0002] When designing some kinds of neural network classifiers, due to the high dimensionality of feature vectors, it often leads to a huge network structure. Huge network will lead to training difficulties, need more training samples, long training time and other disadvantages. In practical applications, it is often desirable to use samples with lower dimensions to construct a classifier with better generalization performance. [0003] Feature selection technology is a technique that converts samples with higher dimensions into samples with lower dimensions throu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/66G06N3/12
Inventor 储荣
Owner HOHAI UNIV
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