Small-power unidirectional and bidirectional controlled silicon test device
A test device and low-power technology, which is applied in the field of low-power unidirectional thyristor test devices, can solve the problems of high price, difficulty in non-professional units or personnel, etc.
Inactive Publication Date: 2014-04-02
王志
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Problems solved by technology
There are many methods and instruments for measuring the performance of one-way thyristor (SCR) or two-way thyristor (BCR). Excellent performance, but there are defects such as high price, difficult to accept by non-professional units or personnel
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[0015] According to attached figure 1 The circuit working principle diagram and accompanying drawings of the low-power unidirectional thyristor test device shown, and the connection relationship between components in each part of the circuit described in the summary of the invention, and the component technology described in the implementation mode The present invention can be realized by implementing the parameter requirements and main points of circuit fabrication, and the related technologies of the present invention will be further described below in conjunction with the embodiments.
[0016] Selection of components and their technical parameters
[0017] The resistance value of resistor R1 is 780Ω; the resistance value of resistor R2 is 1.8KΩ; the resistance value of resistor R3 is 82Ω; the resistance value of resistor R4 is 15KΩ;
[0018] LED1 is a red light-emitting diode, LED2 is a green light-emitting diode, choose a bright light-emitting diode with a diameter of ￠5m...
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The invention relates to a small-power unidirectional and bidirectional controlled silicon test device, which is characterized by comprising an integrated circuit DIP socket, a test performance display circuit, a controlled silicon triggering signal loop and a direct current power supply circuit, wherein the test performance display circuit consists of a converting switch K-1, a red LED (light emitting diode) 1, a resistor R2, a green LED 2 and a resistor R1, the controlled silicon triggering signal loop consists of a converting switch K-2, a resistor R3 and a resistor R4, the direct current power supply circuit consists of a converting switch K-3, a 6V direct current power supply, a 9V direct current power supply and a power supply switch SW, a jack A (jack T1) of the integrated circuit DIP socket is connected with a pin 3 of the converting switch K-1, a jack K (jack T2) of the integrated circuit DIP socket is connected with a pin 3 of the converting switch K-3, and a jack G (jack G1) of the integrated circuit DIP socket is connected with a pin 3 of the converting switch K-2 through a button switch AN.
Description
technical field [0001] The invention belongs to the technical field of electronic component measurement, and relates to a low-power one-way bidirectional thyristor testing device. Background technique [0002] In electronic design or maintenance work, it is often necessary to use low-power thyristor components with a voltage below 500V and a current within 5A. There are many methods and instruments for measuring the performance of one-way thyristor (SCR) or two-way thyristor (BCR). The performance is excellent, but there are defects such as high price and difficulty in acceptance by non-professional units or personnel. In order to make up and overcome these problems, it is necessary to develop a simple circuit structure, low production cost, stable performance, and practical instrument for measuring the performance of one-way thyristor (SCR) or bidirectional thyristor (BCR). [0003] The low-power unidirectional triac test device can quickly test the performance of these t...
Claims
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Inventor 王志
Owner 王志