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test sorter

A technology for testing sorting machines and test windows, which can be used in sorting, measuring electricity, measuring devices, etc., and can solve problems such as condensation

Active Publication Date: 2016-08-10
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is still a problem that it is difficult to prevent condensation from occurring at a portion where a heater cannot be provided or at a portion to which heat from a heater cannot be sufficiently transmitted.

Method used

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Embodiment Construction

[0023] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily realize the preferred embodiments. For the sake of brevity, some descriptions are omitted or shortened if they are redundant or irrelevant to the features of the present invention.

[0024] figure 1 is a conceptual plan view showing the configuration of the test handler 100 according to the present invention. figure 2 yes figure 1 A conceptual rear view of the test handler 100. image 3 is shown enlarged figure 2 A perspective view of the air guide of the test handler 100. Figure 4 is shown figure 1 A reference view of the operation of key parts of the test handler 100.

[0025] Such as figure 1 As shown, the test handler 100 according to the present invention comprises a test tray TT, a loading device 110 , a testing chamber 120 , an unloading device 130 , a central support 140 , a fast...

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Abstract

A test handler supporting semiconductor device testing is disclosed herein. The test handler includes dry air supply means for supplying dry air to the test windows of the test chamber, thus preventing condensation that may occur when performing low temperature tests.

Description

technical field [0001] The present invention relates to a test handler for testing semiconductor devices. Background technique [0002] A test sorter is an apparatus that electrically connects semiconductor devices that have been manufactured through a predetermined manufacturing process to a tester and sorts the semiconductor devices according to test results. [0003] Test sorters are described in or belong to many patent documents (for example, Korean Patent Publication No. 10-2008-0018079 (Patent Document 1), Korean Patent Registration No. 10-0532626 (Patent Document 2), etc.) Technology. [0004] In general, since semiconductor devices are used in various use environments (for example, temperature environments), a test handler that can be used not only in a room temperature test environment but also in a high-temperature or low-temperature test environment is required. [0005] Specifically, regarding the low-temperature test, although the minimum test limit temperatu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/344
CPCG01R31/2862G01R31/2867G01R31/2881
Inventor 具泰兴卢钟基
Owner TECHWING CO LTD