A test transfer mechanism
A technology of transfer mechanism and test board, applied in the direction of connection, incandescent lamp, optics, etc., can solve the problems of easily damaged test board and difficult probe installation, and achieve the effect of convenient use, difficult probe installation and simple operation
Active Publication Date: 2016-04-06
BOZHON PRECISION IND TECH CO LTD
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Problems solved by technology
[0003] The purpose of the present invention is to provide a test adapter mechanism for the deficiencies of the prior art, which is suitable for multi-point connection and solves the difficulty of probe installation; the adapter also solves the problem of easy damage caused by multiple insertions and withdrawals of the test board
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[0024] Examples, see attached Figure 1-10 , a test transfer mechanism, which includes a base plate 1, a test board 2, a base 3 of a test body, a test body 4, and a transfer mechanism I, the test board and the base of the test body are respectively installed on the base plate, and the The object to be tested can be placed on the base of the object to be tested;
[0025] The transfer mechanism includes a support column 5, a probe fixing lower plate 6, a probe 7, a connection plate 8, a data acquisition plate 9, a spacer 10, a rotating shaft 11, a pressure plate 12, a pressure plate bump 13, an upper pressure plate 14, and a cover Plate 15, probe fixing upper plate 16, positioning column 17, spring 18, guide column 19, hand pressing block 20, cushion block a21, pressing base 22, pressing block 23 and lower pressing block 24, the lower end of the support column Fixed on the bottom plate, the upper end is equipped with a probe fixed lower plate, the rear of the probe fixed lower ...
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The invention relates to a testing changeover mechanism which comprises a bottom plate, a testing plate, a base of an object to be tested, the object to be tested and a changeover mechanism. The testing plate and the base of the object to be tested are installed on the bottom plate respectively. The object to be tested is arranged on the base of the object to be tested. When a press block is pressed, the press block presses a hand press block so that the hand press block can press a press plate. The press plate is pressed so that a press plate protruding block can press an upper press plate. The upper press plate is moved downwards through a spring, so that a probe is exposed out of the top of the upper press plate, and therefore the probe is in contact with a detection face and signal conduction is achieved. Afterwards, a data collecting plate is used for collecting and transmitting data to the testing plate to achieve changeover. The testing changeover mechanism adapts to multiple-point connection and the problem that a probe is hard to install is solved. In addition, the problem that the testing plate is prone to damage by being plugged and unplugged by multiple times is solved through changeover. The testing changeover mechanism is a mechanism which can test a circuit without being in direct contact with the testing plate and is designed to be applied to testing of functions and capacities of an LCD display screen. The testing changeover mechanism is easy to operate and convenient to use in a test.
Description
Technical field: [0001] The present invention relates to the field of test transfer mechanism equipment, and more specifically relates to a mechanism designed for function and performance testing of LCD display screens, which can test circuits without directly touching a test board. Background technique: [0002] The function and performance of the LCD display need to be tested. Generally, the circuit is tested by directly contacting the test board. During the test, sometimes it is difficult to install the probes, and the test board is easily damaged due to repeated plugging and unplugging. Bring a lot of inconvenience, also increased production cost. Invention content: [0003] The purpose of the present invention is to provide a test adapter mechanism for the deficiencies of the prior art, which is suitable for multi-point connection and solves the difficulty of probe installation; the adapter also solves the problem that the test board is easily damaged due to multiple ...
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IPC IPC(8): G02F1/13H01R33/94
Inventor 吕绍林蔡志敏刘辉张文生赵亮
Owner BOZHON PRECISION IND TECH CO LTD