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Voltage probe

A technology of voltage probes and metal probes, applied in the direction of measuring electricity, measuring electrical variables, components of electrical measuring instruments, etc., can solve the problems of reduced test accuracy, mutual interference, etc., to shield external interference, improve accuracy, and solve problems. Mutual interference effect

Inactive Publication Date: 2014-05-21
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present invention provides a voltage probe to solve the technical problem in the prior art that the test accuracy is reduced due to mutual interference between multiple voltage probes when measuring a test point with a short distance

Method used

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Embodiment Construction

[0023] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0024] see figure 1 , figure 1 A structural sectional view of a voltage probe provided by an embodiment of the present invention. The voltage probe comprises: a metal probe 11, a probe body 12, a metal probe handle 13 and an insulating shielding jacket 14, wherein one end of the insulating shielding jacket 14 and the tail end of the metal probe handle 13 are respectively connected to the probe body 12, the insulating shielding jacket 14 is on the same side as the m...

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Abstract

An embodiment of the invention provides a voltage probe. The voltage probe comprises a metal probe, a probe body, a metal probe handle and an insulation shielding outer sleeve. One end of the insulation shielding outer sleeve and the tail end of the metal probe handle are connected onto the probe body respectively, the insulation shielding outer sleeve and the metal probe handle are on the same side, and the insulation shielding outer sleeve is disposed on the outer side of the metal probe handle. The head end of the metal probe handle is connected with the tail end of the metal probe, a hole is formed in the other end of the insulation shielding outer sleeve, and the head end of the metal probe penetrates the hole to be exposed out of the insulation shielding outer sleeve. The insulation shielding outer sleeve covers the metal probe handle and the tail end of the metal probe and is connected with the two sides of the metal probe handle. By means of the voltage probe, the technical problem that the test accuracy is reduced due to interference among a plurality of voltage probes when test points in short distance are measured in the prior art is solved.

Description

technical field [0001] The invention relates to the technical field of electronic measurement, in particular to a voltage probe. Background technique [0002] The so-called voltage probe is defined as the conductor connecting the measured point and the measuring equipment. Usually, the existing voltage probe includes two parts: the probe body and the probe (ie, the metal probe), wherein the probe is in the shape of " The ten" shape can be plugged and pulled out in the probe body. During normal use, it is fixed by the card force of the probe body. The probe is exposed and directly touches the position of the measured point. When not in use, the probe can be pulled out and stored away. [0003] In the existing voltage probe, since the front end of the voltage probe body (near the probe side) and the probe are both metal, they are directly exposed when in use, and are susceptible to external electromagnetic interference. In particular, when two or more test points are close t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R1/067G01R1/18
Inventor 苏勇
Owner HUAWEI TECH CO LTD