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Method for judging questionable value of sample testing data

A technology for detecting data and samples, applied in the field of judging suspicious values ​​of sample data, can solve the problems of reducing the accuracy and reliability of test data, unable to find and eliminate abnormal data, etc., and achieve the effect of improving accuracy and reliability.

Active Publication Date: 2014-06-11
PANZHIHUA IRON & STEEL RES INST OF PANGANG GROUP
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  • Application Information

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Problems solved by technology

[0002] Usually, the methods and rules of mathematical statistics are used in the statistical analysis of sample detection data, such as Grubbs test, Dixon test, etc. And Dixon test often have blind spots, in the case of non-normal distribution (that is, there are extreme values), often some abnormal data cannot be found and eliminated, reducing the accuracy and reliability of the detection data

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  • Method for judging questionable value of sample testing data
  • Method for judging questionable value of sample testing data
  • Method for judging questionable value of sample testing data

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Embodiment Construction

[0018] Now, embodiments of the present invention will be described in detail, examples of which are illustrated in the accompanying drawings. The embodiments are described below in order to explain the present invention by referring to the figures.

[0019] figure 1 is a flow chart illustrating a method for judging suspicious values ​​of sample detection data according to an embodiment of the present invention.

[0020] In step S101, the detection data of the same element of the same sample in m laboratories are measured n times to form m sets of data, each set of data has n values, where m and n are greater than or equal to 1 integer.

[0021] In step S102, an average value is calculated for the n values ​​of each laboratory to obtain m data, and the m data are used as measurement results of sample detection data.

[0022] Specifically, n values ​​of each laboratory are obtained through step S101. In step S102, the average value is calculated for n values ​​​​of each labo...

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Abstract

The invention relates to a method for judging a questionable value of sample testing data. The method comprises the following steps: carrying out measurement for n times on testing data of one same element of one same sample in m laboratories, so as to form m groups of data, wherein each group of data includes n numerical values, and m and n represent integers more than or equal to 1; calculating an average value of the n numerical values of each laboratory to obtain m data which serves as measuring results of the sample testing data; calculating a robust Z score of the measuring result of the sample testing data of each laboratory according to the measuring results of the sample testing data; and judging the questionable value of the sample testing data according to the value range of the robust Z scores of the measuring results of the sample testing data of laboratories.

Description

technical field [0001] The invention relates to the field of judging suspicious values ​​of sample data, and more specifically, relates to a method for judging suspicious values ​​of detected data of samples (especially metallurgical sample elements). Background technique [0002] Usually, the methods and rules of mathematical statistics are used in the statistical analysis of sample detection data, such as Grubbs test, Dixon test, etc. In the case of non-normal distribution (that is, there are extreme values), some abnormal data cannot be found and eliminated, which reduces the accuracy and reliability of the detection data. Contents of the invention [0003] The invention uses a robust statistical technique to process the data, can effectively overcome the blind spots of the general Grubbs test and the Dixon suspicious value test, and achieves good results. In order to achieve the above object, the object of the present invention is to provide a method for judging suspi...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N33/00G01N33/20
Inventor 徐本平
Owner PANZHIHUA IRON & STEEL RES INST OF PANGANG GROUP