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An Ultrafast Electronic Pulse Width Measurement System

An electronic pulse and width measurement technology, which is applied in pulse characteristic measurement and other directions, can solve the problems of insufficient voltage rise, insufficient electronic pulse width, limited photoconductive switch working efficiency, etc.

Active Publication Date: 2017-02-08
EAST CHINA NORMAL UNIV
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0004] The invention overcomes the shortcomings of the traditional streak camera that the working efficiency of the photoconductive switch makes the voltage rise not fast enough or not strong enough, and the defect that the autocorrelation method cannot measure the compressed electronic pulse width, and proposes an ultra-fast electronic pulse width measurement system

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  • An Ultrafast Electronic Pulse Width Measurement System
  • An Ultrafast Electronic Pulse Width Measurement System
  • An Ultrafast Electronic Pulse Width Measurement System

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Embodiment Construction

[0023] The present invention will be further described in detail in conjunction with the following specific embodiments and accompanying drawings. The process, conditions, experimental methods, etc. for implementing the present invention, except for the content specifically mentioned below, are common knowledge and common knowledge in this field, and the present invention has no special limitation content.

[0024] figure 1 Shown is a structural diagram of the ultrafast electronic pulse width measurement system of the present invention, which mainly includes a fundamental frequency signal device 10 , a pulse radio frequency transmitting device 20 and a radio frequency deflection cavity 30 .

[0025] The baseband signal device 10 includes a laser signal source 11 , a synchronous electrical signal conversion unit 12 and a preamplification unit 13 . The laser signal source 11 is a femtosecond laser oscillator, which emits a phase-locked laser signal. The repetition frequency of...

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Abstract

The invention discloses an ultra-fast electronic impulse width measuring system. The ultra-fast electronic impulse width measuring system comprises a base frequency signal device, an impulse radio frequency emitting device and a radio frequency deflection cavity. The base frequency signal device is used for generating a sine continuous wave signal with the locked phase, the impulse radio frequency emitting device is connected with the base frequency signal device and used for amplifying and modulating the sine continuous wave signal to obtain a high-power impulse radio frequency signal, the radio frequency deflection cavity is connected with the impulse radio frequency emitting device, the high-power impulse radio frequency signal is coupled into the radio frequency deflection cavity to form a time varying magnetic field perpendicular to the propagation direction of an ultra-fast electronic impulse, the longitudinal impulse width of the ultra-fast electronic impulse is converted into the transverse deflection distance, and the impulse width of the ultra-fast electronic impulse can be measured. According to the ultra-fast electronic impulse width measuring system, the radio frequency deflection technology is introduced, the radio frequency deflection cavity with the high-quality factor is adopted, the action zone of the magnetic field in the deflection cavity is only 5 mm, and the electronic impulse at the sample position can be accurately measured.

Description

technical field [0001] The invention relates to the research field of ultrafast electron dynamics, in particular to an ultrafast electron pulse width measurement system. Background technique [0002] Many physical, chemical, and biological phenomena in nature have microscopic and ultrafast characteristics. To detect the occurrence of these phenomena requires detection instruments with extremely high spatial resolution and time resolution. Ultrafast electron diffraction is very one of the effective means. Its spatial and temporal resolutions depend on the de Broglie wavelength and longitudinal pulse width of the electrons, respectively, so measuring the electron pulse width is of great significance for the time resolution of ultrafast electron diffraction. [0003] The most traditional electronic pulse width measurement method is the streak camera method (Rev.Sci.lnstrum.71,3627). When it is necessary to measure the pulse width of electrons, the photoconductive switch is us...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/02
Inventor 裴敏洁齐大龙齐迎朋杨岩陈瑜婷张诗按孙真荣
Owner EAST CHINA NORMAL UNIV