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Solid sampling device

A sampling device and solid technology, applied to the sampling device and other directions, can solve the problems of inability to achieve structure and material, difficult in-situ analysis of cultural relics, and large damage to cultural relics, and achieve the effects of simple and fast sampling, small damage to cultural relics, and easy replacement.

Active Publication Date: 2014-07-23
江苏先进无机材料研究院
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  • Abstract
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Problems solved by technology

[0003] At present, due to the principle of protection, the non-destructive analysis of cultural relics mainly stays in the analysis of surface materials. The thickness of the analysis is only a few millimeters, and it is impossible to do deeper structural and material analysis.
[0004] However, the existing analysis techniques such as X-ray diffraction analysis technique (XRD), microprobe scanning analysis technique (u-SRXRF) and scanning electron microscope analysis technique (SEM) are not easy to achieve in-situ analysis of cultural relics, and to a certain extent Cultural relics need to be damaged
[0005] As for the sampling during the damage analysis of cultural relics, most of them are to scrape the material on the surface of cultural relics or take a larger piece of overall material for analysis, which will cause considerable damage to cultural relics.

Method used

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Embodiment Construction

[0035] The solid sampling device of the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments. figure 1 A schematic structural view showing an embodiment of the solid sampling device according to the present invention; figure 2 show figure 1 A longitudinal cross-sectional view of the solids sampling device shown.

[0036] refer to figure 1 and figure 2 As shown, the solid sampling device of the present invention includes a base 1, and the base 1 has a hollow main body 1a and a bottom 1b located below the main body 1a. The screw rod 2 is inserted into the main body portion 1a of the bottom 1 so as to be movable up and down. The solid sampling device also includes a sampling tube 5 disposed in the main body 1a, the upper end 5a of the sampling tube 5 is connected to the lower end 2a of the screw rod 2, and the lower end 5b of the sampling tube 5 penetrates the bottom 1b of the base 1.

[0037] By connec...

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Abstract

The invention discloses a solid sampling device. The solid sampling device comprises a hollow main body part, a base located at a bottom below the main body part, a spiral rod inserted in the main body part by moving up and down, and a sampling tube in the main body part, wherein the upper end of the sampling tube is connected with the lower end of the spiral rod, and the lower end of the sampling tube penetrates through the bottom. With the adoption of the solid sampling device disclosed by the invention, the layered structures and material information of historical relics can be conveniently obtained; moreover, the solid sampling device causes small damages to original historical relics, and is simple and fast to operate, and convenient to carry.

Description

technical field [0001] The invention belongs to the field of cultural relics protection, and relates to a solid sampling device, in particular to a solid sampling device which can be used for sampling solids such as pottery figurines, painted paintings, murals, soil minerals and the like in cultural relics protection. Background technique [0002] The Chinese nation has a long history and splendid culture, and the historical and cultural relics left by the ancestors are worthy of protection, inheritance and development by future generations. However, due to natural weathering and changes in the natural environment, the existing cultural relics have been damaged to varying degrees. In order to better protect and restore damaged cultural relics such as murals, pottery figurines and painted paintings, it is necessary to do in-depth research on their layered structure and materials. [0003] At present, due to the principle of protection, the non-destructive analysis of cultura...

Claims

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Application Information

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IPC IPC(8): G01N1/08
Inventor 郑文平卓尚军
Owner 江苏先进无机材料研究院
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