X-ray Micro-area Absorption Spectrum Measurement Method with Spatial Resolution Capability
A measurement method and spatially resolved technology, applied in the fields of X-ray absorption spectroscopy and X-ray imaging, can solve the problems of expensive manufacturing, limited X-ray applications, and time-consuming data acquisition methods
Active Publication Date: 2017-11-07
INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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[0008] The above data acquisition methods are very time-consuming, and the accuracy of data acquisition is easily affected by factors such as the accuracy of sample movement and the stability of the incident X-ray light source, and the manufacturing cost of optical components such as focusing mirrors is expensive, which is not conducive to the promotion of X-ray absorption spectroscopy technology and limits The application of X-ray absorption spectroscopy technology in materials science and other fields
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[0030] Embodiments will now be described more fully with reference to the accompanying drawings. Embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the embodiments to this present invention. technical personnel in the field.
[0031] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the invention. However, one skilled in the art will appreciate that the technical solutions of the present invention may be practiced without one or more of the specific details, or that other methods, components, materials, etc. may be employed. In other instances, well-known struc...
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The invention provides a method for measuring X-ray micro-region absorption spectrum with spatial resolution, which is characterized in that it includes: generating X-ray monochromatic light with predetermined energy; recording the intensity information of the X-ray monochromatic light; The imaging detectors of multiple pixel units collect the X-ray monochromatic light after passing through the sample, so as to obtain the absorption spectrum information of the sample under the predetermined energy. In the present invention, the X-ray imaging detector is used to collect sample two-dimensional projection data within a certain X-ray energy range, and the X-ray absorption spectrum information of the sample area represented by each pixel can be obtained respectively at the same time.
Description
technical field [0001] The invention relates to the technical fields of X-ray absorption spectrum and X-ray imaging, and particularly designs an X-ray absorption spectrum measurement method with spatial resolution capability. Background technique [0002] X-ray absorption spectrum (X Ray Absorption Fine Structure, XAFS) represents the change curve of the absorption coefficient μ of the sample and the X-ray energy E, which contains rich structural information of the sample. By properly analyzing the X-ray absorption spectrum, information about the geometric structure and electronic structure of the sample can be obtained. Therefore, X-ray absorption spectroscopy has important application prospects and application values in many scientific fields such as chemistry, biology, materials, environment, and geology, and has become a structure determination tool welcomed by scientists in various disciplines. [0003] So far, most of the current XAFS experiments are carried out on ...
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IPC IPC(8): G01N23/083
Inventor 张凯吴雪卉朱佩平袁清习黄万霞
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI