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General Information Processing Platform Based on Automated Test System

An information processing platform and automated testing technology, applied in electrical digital data processing, special data processing applications, error detection/correction, etc., can solve the problems of complex signal types, low efficiency, and difficulty in manual testing, and achieve structural process optimization. , Easy to make mistakes, high conversion efficiency

Active Publication Date: 2018-08-28
武汉中元通信股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, the testing requirements for communication equipment are also increasing day by day. There are many types of equipment, complex signal types, and complex function and performance index systems, which lead to more and more complex testing of communication equipment modules. Manual testing is difficult and inefficient.

Method used

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  • General Information Processing Platform Based on Automated Test System
  • General Information Processing Platform Based on Automated Test System

Examples

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Embodiment Construction

[0027] See figure 1 with figure 2 Shown are specific embodiments of the present invention.

[0028] Combine figure 1 with figure 2 It can be seen that the present invention includes a level conversion unit 1, a single-chip processing unit 2 and an FPGA processing unit 3 are combined to form a whole, in which:

[0029] The level conversion unit 1 further includes an input and output interface 11, a 3.3V / 2.5V voltage conversion module 12, and a RS232 / CMOS level conversion module 13; and the first pin of the input and output interface J1 will be connected to 3.3 The power supply is divided into three outputs: the first channel is directly connected to the first pin VIN of the level conversion module U1, the second channel is connected to the 64th pin AVCC of the single-chip processing module U3, and the third channel is connected to the FPGA processing module U4. 11 pins are connected to VDDP; the 7th and 8th pins of the input and output interface J1 are connected to the 2nd and 7...

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PUM

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Abstract

The invention discloses a general information processing platform based on an automated testing system. The general information processing platform comprises a level switch unit 1, a single chip microcomputer processing unit 2 and an FPGA processing unit 3, wherein the level switch unit 1, the single chip microcomputer processing unit 2 and the FPGA processing unit 3 are connected into a whole. The level switch unit comprises an input and output interface J1, a 3.3 V / 2.5 V voltage conversion module U1 and an RS232 / CMOS level mutual conversion module U2. The single chip microcomputer processing unit comprises a single chip microcomputer processing module U3. The FPGA processing unit 3 comprises an FPGA processing module U4 and an output interface J2. According to the general information processing platform based on the automated testing system, a concise and clear distributed layout way is adopted for orderly ranking all units on a printed board, concentrated interfaces are adopted for reasonably leading out key pins, and good data interaction between an external computer and base layer hardware is achieved. The general information processing platform has the advantages of being reasonable in design, compact in structure, good in stability, easy to debug, high in reliability and the like.

Description

Technical field [0001] The invention relates to an information processing platform, in particular to a general information processing platform based on an automated test system. Background technique [0002] With the rapid development of communication technology in recent years, communication equipment is moving towards more superior performance, more diversified functions, and more compact size. At the same time, the testing requirements of communication equipment are also increasing day by day, with a wide variety of equipment, complex signal types, and complex functions and performance index systems, resulting in more and more complex testing of communication equipment modules, and manual testing is difficult and inefficient. Automatic testing overcomes the cumbersome and low efficiency of manual testing to a certain extent, and can use the powerful processing capabilities of computers to perform necessary processing on measurement data. Automated testing is built on the basi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/30
CPCG06F11/2205
Inventor 马红春黄祥白瑞峰凡亚伟曾袁军吴浩李超童杰李洋马琼芳王汉军邹功勋刘小燕禹志华夏宇徐维王博玮
Owner 武汉中元通信股份有限公司
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