General Information Processing Platform Based on Automated Test System
An information processing platform and automated testing technology, applied in electrical digital data processing, special data processing applications, error detection/correction, etc., can solve the problems of complex signal types, low efficiency, and difficulty in manual testing, and achieve structural process optimization. , Easy to make mistakes, high conversion efficiency
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[0027] See figure 1 with figure 2 Shown are specific embodiments of the present invention.
[0028] Combine figure 1 with figure 2 It can be seen that the present invention includes a level conversion unit 1, a single-chip processing unit 2 and an FPGA processing unit 3 are combined to form a whole, in which:
[0029] The level conversion unit 1 further includes an input and output interface 11, a 3.3V / 2.5V voltage conversion module 12, and a RS232 / CMOS level conversion module 13; and the first pin of the input and output interface J1 will be connected to 3.3 The power supply is divided into three outputs: the first channel is directly connected to the first pin VIN of the level conversion module U1, the second channel is connected to the 64th pin AVCC of the single-chip processing module U3, and the third channel is connected to the FPGA processing module U4. 11 pins are connected to VDDP; the 7th and 8th pins of the input and output interface J1 are connected to the 2nd and 7...
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