A kind of automatic test method and main control device

A technology of automated testing and master control devices, applied in the electronic field, can solve problems such as low efficiency and low automation level, and achieve the effect of reducing manpower and time, saving manpower and time, and reducing manpower and time required for testing

Active Publication Date: 2017-12-29
LENOVO (BEIJING) LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The embodiment of the present application provides an automatic testing method and a main control device, which solves the technical problems of low automation level and low efficiency in the testing method in the prior art, realizes the technical effect of automatic testing, and effectively improves the testing performance. Efficiency, which greatly reduces the manpower and time required for testing

Method used

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  • A kind of automatic test method and main control device
  • A kind of automatic test method and main control device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] In Embodiment 1, an automated test method is provided, which is applied to the main control device. When the main control device is connected to the device under test, the automated test method can be applied to the BIOS test, and can also be applied to the stable Sex tests are not listed one by one in the embodiments of the present application.

[0045] Please refer to figure 1 , figure 1 It is the main flowchart of the automated testing method in Embodiment 1 of the present application, and the method includes the following steps:

[0046] Step S101, acquiring test button information stored in the storage device of the main control device based on a test command;

[0047] Step S102, converting the test key information into a standard keyboard scan code;

[0048] Step S103, outputting the standard keyboard scan code to the device under test, so that the device under test enters a test state;

[0049] Step S104, obtaining and storing a test result generated after th...

Embodiment 2

[0085] In the second embodiment, a main control device is provided, which can be connected with the device under test.

[0086] Please refer to figure 2 , is a structural diagram of the main control device in Embodiment 2 of the present application, and the device 201 specifically includes:

[0087] The keyboard key emulator 202 is used to obtain the test key information stored in the main control device based on a test instruction, and convert the test key information into a standard keyboard scan code; output the standard keyboard scan code to the a device under test, so that the device under test enters a test state;

[0088] The main control module 203 is configured to obtain and store the test result generated after the device under test enters the test state.

[0089] In a specific implementation process, the main control module 203 is further configured to obtain N pieces of test button information by responding to at least one input operation based on a preset input...

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Abstract

The invention discloses an automatic test method and a main control device. The method is applied to the main control device. When the main control device is connected to the device under test, the method includes: acquiring a memory stored in the main control device based on a test command. Test button information in the device, and convert the test button information into a standard keyboard scan code; output the standard keyboard scan code to the device under test, so that the device under test enters the test state; obtain and store the generated data after the device under test enters the test state Test Results. The method and device provided by the invention are used to solve the technical problems of low automation level and low efficiency in the testing method in the prior art, realize the technical effect of automatic testing, and then effectively improve the testing efficiency, so that the manpower and labor required for testing The time is greatly reduced.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to an automatic testing method and a main control device. Background technique [0002] For manufacturers of computers, mobile phones and communication equipment products, a lot of testing work is required before the products leave the factory. On the one hand, it can eliminate products that do not meet the factory requirements, and on the other hand, it can also detect the overall stability of the product. and reliability. [0003] Take the more common BIOS test and stability test as an example. During the test, the tester needs to stay in front of the device under test. According to the test progress displayed on the display of the device under test, manually enter the key code on the keyboard. , to perform operations such as BIOS refresh or restart, and at the same time, testers also need to observe the test results displayed on the display of the device under test in real t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F11/22
Inventor 于泳罗曦乔海波
Owner LENOVO (BEIJING) LTD
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