Electrostatic discharge protection circuit capable of bearing excess electric property stress and avoiding latching

Abstract

An electrostatic discharge protection circuit capable of bearing excess electric property stress and avoiding latching comprises a main electrostatic discharge circuit, a voltage level detection circuit, and an static drive circuit; the main electrostatic discharge circuit is coupled between a first terminal and a second terminal, and comprises a control end; the main electrostatic discharge circuit is used for setting up electric connection between the first and second terminals according to the voltage of the control end; the voltage level detection circuit is coupled between the first and second terminals, and used for setting the voltage of the control end when the voltage of the first terminal is higher than a limited voltage; the static drive circuit is used for driving the main electrostatic discharge circuit when electrostatic discharge phenomenon happens. The electrostatic discharge protection circuit not only has the electrostatic protection function, but also can bear excess electric property stress and avoid latching.

Description

technical field [0001] The invention relates to an electrostatic discharge protection circuit, in particular to an electrostatic discharge protection circuit with a voltage level detection circuit and an electrostatic drive circuit. Background technique [0002] Electrostatic Discharge (ESD) and Electrical Overstress (EOS) are the main factors that cause damage to most electronic components or electronic systems, causing temporary failure or permanent damage to electronic components or electronic systems . Such unintended electrical stress damage will cause damage to electronic components, affect the circuit function of integrated circuits (Integrated Circuits, IC), and make electronic products work abnormally. [0003] The occurrence of ESD damage may be caused by many factors, and it is often difficult to avoid. For example, during the process of manufacturing, assembling, testing, and storing electronic components or systems, static electricity will accumulate in the hu...

AI Technical Summary

Problems solved by technology

[0005] However, when the circuit protected by the ESD protection circuit 100 is performing normal operation or a latch up test, an electrical over stress (EOS) phenomenon may occur during the process, causing the ESD protection circuit 100 to protect Latch up occurs in the circuit

Therefore, the existing ESD protection circuit 100 does not have the function of withstanding excessive electrical stress and avoiding latch-up

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