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Preparation method of metal probe

A technology of metal probes and probes, applied in scanning probe technology, scanning probe microscopy, measuring devices, etc., can solve the problems of thick probe tips, difficult to corrode again, and increase the cost of probe corrosion devices

Inactive Publication Date: 2015-02-11
THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These problems will lead to problems such as oxide film on the probe prepared by electrochemical corrosion, thick probe tip, etc.
A common solution is to connect an automatic disconnect to the corrosion circuit, but this adds to the cost of the probe corrosion device
In addition, metal probes are generally short after corrosion, and it is difficult to corrode again and reuse them.

Method used

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  • Preparation method of metal probe
  • Preparation method of metal probe

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Embodiment Construction

[0009] Below in conjunction with accompanying drawing and embodiment the present invention will be described in further detail

[0010] as attached figure 1 As shown in the needle tip corrosion device, the device includes 1. fixture, 2. metal wire, 3. Pt / Ir alloy ring, 4. corrosion solution, 5. three-dimensional mobile platform, 6. normally-off switch, 7. DC power supply.

[0011] The preparation method is as follows: fix the metal wire (2) to be corroded with a clamp (1) so that the free end of the metal wire (2) is along the horizontal direction; connect the platinum-iridium alloy ring (3) to an adjustable DC power supply ( 7), connect the metal wire (2) to the positive pole of the adjustable DC power supply (7) through the normally open switch (6). And the platinum-iridium alloy ring (3) is fixed on the bracket of the three-dimensional translation platform (7). Wherein, a container (4) containing a corrosive solution is arranged under the platinum-iridium alloy ring (3). ...

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PUM

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Abstract

The invention discloses a method for preparing a metal probe through adopting electrochemical corrosion and a device for performing horizontal electrochemical corrosion on the metal probe. The method includes the following steps that: a clamp (1) is utilized to fix a metal wire (2) to be corroded, and the free end of the metal wire (2) is made to be located along a horizontal direction; a platinum iridium alloy ring (3) is connected with the negative pole of an adjustable direct current power source (7), and the metal wire (2) is connected with the positive pole of the adjustable direct current power source (7) through a normally-closed switch (6); the platinum iridium alloy ring (3) is fixed on a support of a three-dimensional translation stage (5); a container filled with a corrosion solution (4) is arranged below the platinum iridium alloy ring (3); and the platinum iridium alloy ring (3) is immersed into the corrosion solution, then is lifted out from the surface of the corrosion solution, and a corrosive solution film is arranged in the platinum iridium alloy ring (3). The method for preparing the metal probe through adopting the electrochemical corrosion and the device provided by the invention have the advantages of being simple and high success rate. The radius of the tip of the metal probe made through adopting the method and device can be smaller than 30nm.

Description

technical field [0001] The invention relates to a method for preparing a metal probe, in particular to a method for preparing a metal probe by electrochemical corrosion. Background technique [0002] High-quality probes are an essential component of scanning probe technology. Different scanning probe technologies require different probe materials and tip diameters. For the tip-enhanced Raman technique (TERS), the probe materials are mainly gold and silver. This is because both have good enhancement effects in the visible light band. In addition, one development direction of scanning probe technology is the combination of scanning tunneling (STM) and atomic force (AFM) microscopy, which requires the use of conductive and slender metal probes instead of the microcantilever used in general AFM. [0003] Probes are usually prepared by electrochemically corroding high-purity metal wires. At present, there are still some problems in the preparation of metal probes, such as rap...

Claims

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Application Information

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IPC IPC(8): G01Q70/16
Inventor 袁秉凯刘新风陈鹏程程志海裘晓辉
Owner THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA
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