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Image sensor and analog to digital converter and analog to digital converting method thereof

An image sensor and analog-to-digital converter technology, applied in the field of image sensors, can solve problems such as power consumption and area burden

Active Publication Date: 2015-02-25
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the number of ADC circuits is controlled by the number of column lines of the pixel array, and as the number increases, it creates a huge burden in terms of power consumption and area

Method used

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  • Image sensor and analog to digital converter and analog to digital converting method thereof

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Embodiment Construction

[0026] Exemplary embodiments will be described in detail with reference to the accompanying drawings. However, the inventive concept may be embodied in various different forms and should not be construed as being limited to only the illustrated exemplary embodiments. Rather, these exemplary embodiments are provided as examples so that this disclosure will be thorough and complete, and will fully convey the concept of the inventive concept to those skilled in the art. Accordingly, known processes, elements and techniques are not described in connection with certain example embodiments of the inventive concepts. Unless otherwise indicated, like reference numerals refer to like elements throughout the drawings and written description, and thus, repeated description will not be made. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity.

[0027] It will be understood that although the terms "first", "second", "third" etc. may be used ...

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Abstract

An image sensor is provided. The image sensor includes a pixel array having active pixel sensors arranged in rows and columns; a correlated double sampler that converts sensing signals transferred from pixels sensors selected from the active pixel sensors to correlated double sampling signals and outputs a conversion result by column; and an analog-to-digital converter that converts the correlated double sampling signals corresponding to plural columns to digital signals using a global code. The analog-to-digital converter includes a column shared operator that performs a digital conversion operation on correlated double sampling signals corresponding to two or more columns of the plural columns.

Description

[0001] This application claims priority from Korean Patent Application No. 10-2013-0096568 filed on Aug. 14, 2013 in the Korean Intellectual Property Office, the entire contents of which are hereby incorporated by reference. technical field [0002] Apparatus, apparatus, methods, and articles of manufacture consistent with the present disclosure relate to an image sensor, and more particularly, to an image sensor using a global counter, an analog-to-digital converter, and an analog-to-digital conversion method. Background technique [0003] In recent years, the use of mobile devices, such as smart phones, tablet PCs, digital cameras, MP3 players, e-books, etc., is proliferating. Most mobile devices include one or more image sensors for capturing images. The image sensor may include a Charge Coupled Device (hereinafter, referred to as CCD) image sensor and a CMOS image sensor. [0004] CCD image sensors have less noise than CMOS image sensors. In addition, the picture quali...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/374H04N5/378
CPCH04N5/378H04N5/3741H04N5/37455H04N25/60H04N25/75H04N25/78H04N25/616
Inventor 金晋佑金敬珉李柾昊蔡熙成郑丞训
Owner SAMSUNG ELECTRONICS CO LTD
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